The Test Set,electronic Systems, cataloged under National Stock Number 6625-01-620-1148, is classified within Federal Supply Class 6625 (Electrical and Electronic Properties Measuring and Testing Instruments) of the Instruments and Laboratory Equipment group. The manufacturer of record is Ewa Technologies, Inc.. Government technical data includes 1 specification, cited from the U.S. Government catalog. The record lists 1 manufacturer part number for this item, enabling identification through both NSN and commercial part number lookups. Current acquisition status: Active.
| Parameter | Value |
|---|---|
| NSN | 6625-01-620-1148 |
| Primary Part Number | XDS-560V2 |
| Item Name | Test Set,electronic Systems |
| FSC / FSG | 6625 / 66 — Electrical and Electronic Properties Measuring and Testing Instruments |
| Manufacturer | Ewa Technologies, Inc. |
| Status | ACTIVE |
| Test Type for Which Designed | SYSTEM TRACE FOR TI DEVICES |
| Acquisition Status | ACTIVE |
| DEMIL Code | DEMIL A — No Demilitarization Required |
| Hazard | Possible hazard — SDS may be required (DLA HMIC P) |
| Criticality Code | X |
| Part Number | Manufacturer |
|---|---|
| XDS-560V2 PRIMARY | Ewa Technologies, Inc. (USA) |
NSN 6625-01-620-1148 is a Test Set,electronic Systems, manufactured by Ewa Technologies, Inc., classified under FSC 6625, Electrical and Electronic Properties Measuring and Testing Instruments. Status: active.
NSN 6625-01-620-1148 has 1 manufacturer part number on file: XDS-560V2 (Ewa Technologies, Inc.).
Key specifications for XDS-560V2: Special Features: POWER OVER USB; ADDITIONAL DEDICATED LED'S; LAN AND USB GRAPHICAL CONFIGURATION AND DIAGNOSTIC TOOL; FLEXIBLE 12.5 INCH CABLE; INCLUDES 20-PIN COMPACT TI (CTI), 14-PIN STANDARD TI AND 20-PIN ARM ADAPTERS; AUTO-ADAPTABLE TCLOCK UP TO 50MHZ; AUTO-SENSING TARGET VOLTAGE RANGE FROM 1.2-4.1 VOLT; JTAG DEBUG ISOLATION; UP TO 100 MHZ EXPORT CLOCK; AUTO COMPENSATING CALIBRATION; ADAPTIVE RECEIVER FOR SETUP/HOLD TIMES UP TO 1.5NS; SUPPORTS JTAG 1149.1 AND 1149.7, 1-4 PIN SYSTEM TRACE WITH 128 MB OF SYSTEM TRACE BUFFER, MOBILE INDUSTRY PROCESSOR INTERFACE SYSTEM TRACE PROTOCOL AND HIGH SPEED PARALLEL TRACE MB; Test Type for Which Designed: SYSTEM TRACE FOR TI DEVICES. 1 specification is documented in the U.S. Government catalog.
Possible hazard — SDS may be required (DLA HMIC P). Hazard information on this page is shown exactly as it appears in the DLA record.
U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-16.
U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-18.