XDS-560V2: TEST SET,ELECTRONIC SYSTEMS.
The TEST SET,ELECTRONIC SYSTEMS is a the manufacturer industrial component. Key specifications include test_type_for_which_designed: SYSTEM TRACE FOR TI DEVICES. This part is cataloged in the U.S.
Government catalog under NSN 6625-01-620-1148, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| test_type_for_which_designed | SYSTEM TRACE FOR TI DEVICES |
| NSN | 6625-01-620-1148 |
| SPECIAL FEATURES | POWER OVER USB; ADDITIONAL DEDICATED LED'S; LAN AND USB GRAPHICAL CONFIGURATION AND DIAGNOSTIC TOOL; FLEXIBLE 12.5 INCH CABLE; INCLUDES 20-PIN COMPACT TI (CTI), 14-PIN STANDARD TI AND 20-PIN ARM ADAPTERS; AUTO-ADAPTABLE TCLOCK UP TO 50MHZ; AUTO-SENSING TARGET VOLTAGE RANGE FROM 1.2-4.1 VOLT; JTAG DEBUG ISOLATION; UP TO 100 MHZ EXPORT CLOCK; AUTO COMPENSATING CALIBRATION; ADAPTIVE RECEIVER FOR SETUP/HOLD TIMES UP TO 1.5NS; SUPPORTS JTAG 1149.1 AND 1149.7, 1-4 PIN SYSTEM TRACE WITH 128 MB OF SYSTEM TRACE BUFFER, MOBILE INDUSTRY PROCESSOR INTERFACE SYSTEM TRACE PROTOCOL AND HIGH SPEED PARALLEL TRACE MB |
| TEST TYPE FOR WHICH DESIGNED | SYSTEM TRACE FOR TI DEVICES |
No substitute or cross-reference records for this part.