The Test Set,electronic Circuit-Comp, cataloged under National Stock Number 6625-01-287-3379, is classified within Federal Supply Class 6625 (No Item Name Available) of the Instruments and Laboratory Equipment group. The primary manufacturer of record is Huntron Inc. Government technical data includes 4 verified specifications, sourced from the Federal Logistics Information System (FLIS). This item has 5 commercial cross-references from 2 manufacturers, enabling identification through both NSN and commercial part number lookups. 8 verified substitutes exist in the FLIS interchangeability database. Current acquisition status: Active.
| Parameter | Value |
|---|---|
| NSN | 6625-01-287-3379 |
| Primary Part Number | 99-0076 |
| Item Name | Test Set,electronic Circuit-Comp |
| FSC / FSG | 6625 / 66 — No Item Name Available |
| Manufacturer | Huntron Inc |
| Status | ACTIVE |
| Departure From Cited Document | PEACETIME DEMAND OBTAIN |
| General Characteristics Item Description | FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT |
| Departure From Cited Document | PEACETIME DEMAND OBTAIN |
| General Characteristics Item Description | FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT |
| Acquisition Status | ACTIVE |
| HAZMAT | No |
| Weight | 29.2000 lbs |
| Cube | 0.6463 cu ft |
| Part Number | Manufacturer |
|---|---|
| 99-0076 PRIMARY | Huntron Inc (USA) |
| 99-0075 | Accelonix (FRA) |
| 99-0075 | Huntron Inc (USA) |
| MODEL 2000 | Huntron Inc (USA) |
| TRACKER 2000 | Huntron Inc (USA) |
NSN 6625-01-287-3379 is a Test Set,electronic Circuit-Comp, manufactured by Huntron Inc, classified under FSC 6625 (No Item Name Available). Status: active.
NSN 6625-01-287-3379 has 5 cross-referenced part numbers: 99-0076 (Huntron Inc), 99-0075 (Accelonix), 99-0075 (Huntron Inc), MODEL 2000 (Huntron Inc), TRACKER 2000 (Huntron Inc).
There are 8 known substitutes for 6625-01-287-3379: 6625-01-217-7608, 6625-01-452-5341, 5970-01-077-0531 and 5 more. Verify interchangeability with system specifications before substitution.
Key specifications for 99-0076: Part Name Assigned by Controlling Agency: TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER V; Departure From Cited Document: PEACETIME DEMAND OBTAIN; General Characteristics Item Description: FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT; Part Name Assigned by Controlling Agency: TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER V. 6 total characteristics are documented in the Federal Logistics Information System.