The CABLE ASSEMBLY,RADIO FREQUENCY is a the manufacturer cable assembly designed for reliable internal or external connectivity in enterprise server and storage environments. Key specifications include departure_from_cited_document: PEACETIME DEMAND OBTAIN, part_name_assigned_by_controlling_agency: TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER V. This product is currently in active production with full OEM support.
This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 6625-01-287-3379, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| departure_from_cited_document | PEACETIME DEMAND OBTAIN |
| part_name_assigned_by_controlling_agency | TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER V |
| NSN | 6625-01-287-3379 |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER V |
| DEPARTURE FROM CITED DOCUMENT | PEACETIME DEMAND OBTAIN |
| GENERAL CHARACTERISTICS ITEM DESCRIPTION | FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | TEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER V |
| DEPARTURE FROM CITED DOCUMENT | PEACETIME DEMAND OBTAIN |
| GENERAL CHARACTERISTICS ITEM DESCRIPTION | FOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT |