32-1967 — SEMICONDUCTOR DEVICE,DIODE

✓ Government record, cited

— · SFP TRANSCEIVER

PRODUCT OVERVIEW

32-1967: SEMICONDUCTOR DEVICE,DIODE.

The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: RUBBER SILICONE CLASS Q OVERALL, hole_diameter: 0.247 INCHES MINIMUM AND 0.256 INCHES MAXIMUM FIFTEENTH HOLE IN, overall_width: 3.460 INCHES MINIMUM AND 3.540 INCHES MAXIMUM IN, aperture_width: 2.210 INCHES MINIMUM AND 2.290 INCHES MAXIMUM IN, overall_length: 5.134 INCHES MINIMUM AND 5.154 INCHES MAXIMUM IN, aperture_length: 5.000 INCHES MINIMUM AND 5.030 INCHES MAXIMUM IN. This part is cataloged in the U.S.

Government catalog under NSN 5961-00-800-3972, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.

Verify compatibility with your specific system configuration before ordering.

WHERE IT FITS

32-1967

NSN: 5961-00-800-3972
NIINs: 008003972, 014438762
FSC: 5961 — Semiconductor Devices and Associated Hardware
CAGE: 57712 — TELEMECHANICS INC (USA)

SPECIFICATIONS

material	RUBBER SILICONE CLASS Q OVERALL
hole_diameter	0.247 INCHES MINIMUM AND 0.256 INCHES MAXIMUM FIFTEENTH HOLE IN
overall_width	3.460 INCHES MINIMUM AND 3.540 INCHES MAXIMUM IN
aperture_width	2.210 INCHES MINIMUM AND 2.290 INCHES MAXIMUM IN
overall_length	5.134 INCHES MINIMUM AND 5.154 INCHES MAXIMUM IN
aperture_length	5.000 INCHES MINIMUM AND 5.030 INCHES MAXIMUM IN
hardness_rating	45.0 SHORE DUROMETER A MINIMUM AND 55.0 SHORE DUROMETER A MAXIMUM OVERALL
style_designator	NON-CIRCULAR
features_provided	HERMETICALLY SEALED CASE
bolt_hole_quantity	14
special_test_features	SPECIAL QUALITY CONTROL TESTING
cross-sectional_thickness	0.032 INCHES NOMINAL IN
NSN	5961-00-800-3972

COMPONENT DIAGRAM

KEY FEATURES

•

FEATURES PROVIDED: HERMETICALLY SEALED CASE

•

NONDEFINITIVE SPEC/STD DATA: 1N751A TYPE

•

MATERIAL: SILICON SEMICONDUCTOR

•

TERMINAL TYPE AND QUANTITY: 2 UNINSULATED WIRE LEAD

TECHNICAL CHARACTERISTICS

FEATURES PROVIDED	HERMETICALLY SEALED CASE
NONDEFINITIVE SPEC/STD DATA	1N751A TYPE
MATERIAL	SILICON SEMICONDUCTOR
TERMINAL TYPE AND QUANTITY	2 UNINSULATED WIRE LEAD

SUBSTITUTES & CROSS-REFERENCES 8

521-024-018Same NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

11-10994-00Same NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

7538002P102Same NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

MIL-PRF-19500/127Reference document

Same NSN cross-reference

Reference document — Identification reference

1N751AReference document

Same NSN cross-reference

Reference document — Secondary reference

525009Reference document

Same NSN cross-reference

Reference document — Secondary reference

LIFECYCLE

NSN statusCancelled· U.S. Government catalog

No demilitarization required

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FREQUENTLY ASKED QUESTIONS

What is 32-1967?

32-1967 is a SEMICONDUCTOR DEVICE,DIODE.

What parts can replace 32-1967?

There are 8 known substitutes for 32-1967: 521-024-018, 11-10994-00, 7538002P102 and 5 more. Substitute compatibility should be verified for your specific system.

What is the NSN for 32-1967?

32-1967 is cataloged in the U.S. Government catalog under NSN 5961-00-800-3972. This indicates validated use in U.S. government and defense supply chains.

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32-1967 — SEMICONDUCTOR DEVICE,DIODE

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