Q531786009 — SEMICONDUCTOR DEVICE,THYRISTOR

✓ Government record, cited

— · SFP TRANSCEIVER

PRODUCT OVERVIEW

Q531786009: SEMICONDUCTOR DEVICE,THYRISTOR.

The SEMICONDUCTOR DEVICE,THYRISTOR is a the manufacturer industrial component. Key specifications include overall_length: 0.502 INCHES NOMINAL IN, mounting_method: THREADED STUD(S), overall_diameter: 0.452 INCHES NOMINAL IN, special_features: INTERNAL JUNCTION CONFIGURATION ARRANGEMENT PNPN, features_provided: HERMETICALLY SEALED CASE, nominal_thread_size: 0.250 INCHES IN. This part is cataloged in the U.S.

Government catalog under NSN 5961-00-228-6819, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.

Verify compatibility with your specific system configuration before ordering.

WHERE IT FITS

Q531786009

NSN: 5961-00-228-6819
FSC: 5961 — Semiconductor Devices and Associated Hardware
CAGE: S3092 — RHEINMETALL AIR DEFENCE AG (CHE)

SPECIFICATIONS

overall_length	0.502 INCHES NOMINAL IN
mounting_method	THREADED STUD(S)
overall_diameter	0.452 INCHES NOMINAL IN
special_features	INTERNAL JUNCTION CONFIGURATION ARRANGEMENT PNPN
features_provided	HERMETICALLY SEALED CASE
nominal_thread_size	0.250 INCHES IN
internal_configuration	JUNCTION CONTACT
semiconductor_material	SILICON
thread_series_designator	UNF
mounting_facility_quantity	1
overall_width_across_flats	0.557 INCHES NOMINAL IN
terminal_type_and_quantity	3 SOLDER STUD
NSN	5961-00-228-6819

COMPONENT DIAGRAM

KEY FEATURES

•

VOLTAGE RATING IN VOLTS PER CHARACTERISTIC: 400.0 MAXIMUM BREAKOVER VOLTAGE, DC

•

MOUNTING FACILITY QUANTITY: 1

•

OVERALL DIAMETER: 0.452 INCHES NOMINAL IN

•

MOUNTING METHOD: THREADED STUD(S)

•

SEMICONDUCTOR MATERIAL: SILICON

•

INTERNAL CONFIGURATION: JUNCTION CONTACT

•

FEATURES PROVIDED: HERMETICALLY SEALED CASE

TECHNICAL CHARACTERISTICS

VOLTAGE RATING IN VOLTS PER CHARACTERISTIC	400.0 MAXIMUM BREAKOVER VOLTAGE, DC
MOUNTING FACILITY QUANTITY	1
OVERALL DIAMETER	0.452 INCHES NOMINAL IN
MOUNTING METHOD	THREADED STUD(S)
SEMICONDUCTOR MATERIAL	SILICON
OVERALL LENGTH	0.502 INCHES NOMINAL IN
INTERNAL CONFIGURATION	JUNCTION CONTACT
FEATURES PROVIDED	HERMETICALLY SEALED CASE
OVERALL WIDTH ACROSS FLATS	0.557 INCHES NOMINAL IN
NOMINAL THREAD SIZE	0.250 INCHES IN

SUBSTITUTES & CROSS-REFERENCES 5

FBP00-024Reference document

Same NSN cross-reference

Reference document — Advisory reference — outside the item-of-supply concept

RELEASE5169Reference document

Same NSN cross-reference

Reference document — Secondary reference

2N3898AReference document

Same NSN cross-reference

Reference document — Secondary reference

525-260-055Same NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

2N3898Reference document

Same NSN cross-reference

Reference document — Secondary reference

LIFECYCLE

NSN statusActive· U.S. Government catalog

No demilitarization required

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FREQUENTLY ASKED QUESTIONS

What is Q531786009?

Q531786009 is a SEMICONDUCTOR DEVICE,THYRISTOR.

What parts can replace Q531786009?

There are 5 known substitutes for Q531786009: FBP00-024, RELEASE5169, 2N3898A and 2 more. Substitute compatibility should be verified for your specific system.

What is the NSN for Q531786009?

Q531786009 is cataloged in the U.S. Government catalog under NSN 5961-00-228-6819. This indicates validated use in U.S. government and defense supply chains.

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Q531786009 — SEMICONDUCTOR DEVICE,THYRISTOR

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