The PROBE,SCANNER is a RTX CORPORATION DBA PRATT & WHITNEY DIV PRATT &WHITNEY industrial component. Key specifications include GENERAL CHARACTERISTICS ITEM DESCRIPTION: CRES; 3.500 IN. LG,0.625 IN.
O/A DIA,0.678 IN. TIP DIA IN. This part is cataloged in the U.S.
Government catalog under NSN 6635-01-113-3087, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
WHERE IT FITS
PWA54270
NSN:6635-01-113-3087 FSC:6635 — Physical Properties Testing and Inspection CAGE:77445 — RTX CORPORATION DBA PRATT & WHITNEY DIV PRATT &WHITNEY (USA)
SPECIFICATIONS
GENERAL CHARACTERISTICS ITEM DESCRIPTION
CRES; 3.500 IN. LG,0.625 IN. O/A DIA,0.678 IN. TIP DIA IN
NSN
6635-01-113-3087
COMPONENT DIAGRAM
KEY FEATURES
•
GENERAL CHARACTERISTICS ITEM DESCRIPTION: CRES; 3.500 IN. LG,0.625 IN. O/A DIA,0.678 IN. TIP DIA IN
TECHNICAL CHARACTERISTICS
GENERAL CHARACTERISTICS ITEM DESCRIPTION
CRES; 3.500 IN. LG,0.625 IN. O/A DIA,0.678 IN. TIP DIA IN
OTHER ITEMS IN FSC 6635 — Physical Properties Testing and Inspection
Items in the same Federal Supply class. No interchangeability or substitution relationship is implied.
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FREQUENTLY ASKED QUESTIONS
What is PWA54270?
PWA54270 is a PROBE,SCANNER manufactured by RTX CORPORATION DBA PRATT & WHITNEY DIV PRATT &WHITNEY.
What parts can replace PWA54270?
There is 1 known substitute for PWA54270: RC-.678. Substitute compatibility should be verified for your specific system.
What is the NSN for PWA54270?
PWA54270 is cataloged in the U.S. Government catalog under NSN 6635-01-113-3087. This indicates validated use in U.S. government and defense supply chains.
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