PROTRACK SCANNER I: TEST SET,SEMICONDUCTOR DEVICE.
The TEST SET,SEMICONDUCTOR DEVICE is a the manufacturer industrial component. Key specifications include depth: 15.000 INCHES NOMINAL IN, width: 11.600 INCHES NOMINAL IN, height: 4.500 INCHES NOMINAL IN, enclosure_feature: SINGLE ITEM W/HOUSING, test_type_for_which_designed: TROUBLESHOOTING, part_name_assigned_by_controlling_agency: PROTRACK I. This part is cataloged in the U.S.
Government catalog under NSN 6625-01-592-2285, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| depth | 15.000 INCHES NOMINAL IN |
| width | 11.600 INCHES NOMINAL IN |
| height | 4.500 INCHES NOMINAL IN |
| enclosure_feature | SINGLE ITEM W/HOUSING |
| test_type_for_which_designed | TROUBLESHOOTING |
| part_name_assigned_by_controlling_agency | PROTRACK I |
| NSN | 6625-01-592-2285 |
| HEIGHT | 4.500 INCHES NOMINAL IN |
| DEPTH | 15.000 INCHES NOMINAL IN |
| ENCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| WIDTH | 11.600 INCHES NOMINAL IN |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | PROTRACK I |
| TEST TYPE FOR WHICH DESIGNED | TROUBLESHOOTING |
No substitute or cross-reference records for this part.