NH1583770: SEMICONDUCTOR DEVICE,DIODE.
The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: SILICON SEMICONDUCTOR, overall_length: 1.374 INCHES NOMINAL IN, mounting_method: THREADED STUD(S), overall_width_across_flats: 0.683 INCHES NOMINAL IN, terminal_type_and_quantity: 1 TAB, SOLDER LUG AND 1 THREADED STUD, current_rating_per_characteristic: 40.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE. This part is cataloged in the U.S.
Government catalog under NSN 5961-01-262-9522, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | SILICON SEMICONDUCTOR |
| overall_length | 1.374 INCHES NOMINAL IN |
| mounting_method | THREADED STUD(S) |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 0.683 INCHES NOMINAL IN |
| terminal_type_and_quantity | 1 TAB, SOLDER LUG AND 1 THREADED STUD |
| current_rating_per_characteristic | 40.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE |
| nuclear_hardness_critical_feature | HARDENED |
| voltage_rating_in_volts_per_characteristic | 200.0 MAXIMUM REVERSE VOLTAGE, PEAK |
| NSN | 5961-01-262-9522 |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 200.0 MAXIMUM REVERSE VOLTAGE, PEAK |
| MOUNTING FACILITY QUANTITY | 1 |
| MOUNTING METHOD | THREADED STUD(S) |
| OVERALL LENGTH | 1.374 INCHES NOMINAL IN |
| OVERALL WIDTH ACROSS FLATS | 0.683 INCHES NOMINAL IN |
| CURRENT RATING PER CHARACTERISTIC | 40.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE |
| MATERIAL | SILICON SEMICONDUCTOR |
| TERMINAL TYPE AND QUANTITY | 1 TAB, SOLDER LUG AND 1 THREADED STUD |
| NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |