The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: CERAMIC ENCLOSURE, overall_length: 1.253 INCHES MAXIMUM IN, mounting_method: THREADED STUD(S), overall_diameter: 0.290 INCHES MAXIMUM IN, nominal_thread_size: 0.190 INCHES IN, thread_series_designator: UNF. This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 5961-01-069-4899, indicating validated use in U.S.
government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels. Verify compatibility with your specific system configuration before ordering.
| material | CERAMIC ENCLOSURE |
| overall_length | 1.253 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| overall_diameter | 0.290 INCHES MAXIMUM IN |
| nominal_thread_size | 0.190 INCHES IN |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 0.424 INCHES MINIMUM AND 0.437 INCHES MAXIMUM IN |
| terminal_type_and_quantity | 1 TAB, SOLDER LUG AND 1 THREADED STUD |
| voltage_rating_in_volts_per_characteristic | 90.0 NOMINAL BREAKDOWN VOLTAGE, DC |
| maximum_operating_temp_per_measurement_point | 125.0 CELSIUS AMBIENT AIR DEGC |
| NSN | 5961-01-069-4899 |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 90.0 NOMINAL BREAKDOWN VOLTAGE, DC |
| MOUNTING FACILITY QUANTITY | 1 |
| MOUNTING METHOD | THREADED STUD(S) |
| MATERIAL | SILICON SEMICONDUCTOR |
| TERMINAL TYPE AND QUANTITY | 1 TAB, SOLDER LUG AND 1 THREADED STUD |
| THREAD SERIES DESIGNATOR | UNF |
| NOMINAL THREAD SIZE | 0.190 INCHES IN |
| OVERALL LENGTH | 1.253 INCHES MAXIMUM IN |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 125.0 CELSIUS AMBIENT AIR DEGC |
| OVERALL WIDTH ACROSS FLATS | 0.424 INCHES MINIMUM AND 0.437 INCHES MAXIMUM IN |