K05-1100: TEST STATION,ELECTRICAL-ELECTRON.
TEST STATION,ELECTRICAL-ELECTRON. Key specifications include unpackaged_unit_width: 12.000 INCHES NOMINAL IN, functional_description: PROVIDES MEASUREMENT, SWITCHING AND STIMULUS GENERATION CAPABILITY REQUIRED FOR TESTING MULTIPLE ADI UNITS UNDER TEST, unpackaged_unit_height: 9.000 INCHES NOMINAL IN, unpackaged_unit_length: 27.000 INCHES NOMINAL IN, end_item_identification: ATTITUDE DIRECTOR INDICATOR, reference_data_and_literature: TO 51T7-2-1. This part is cataloged in the U.S.
Government catalog under NSN 4920-01-540-5520, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| special_features | CONSISTS OF PXI/PCI INSTRUMENTS AND A CONTROLLER INSTALLED IN A CHASSIS WITH A COMMON CONNECTOR INTERFACE FOR ADI BEING TESTED |
| unpackaged_unit_width | 12.000 INCHES NOMINAL IN |
| functional_description | PROVIDES MEASUREMENT, SWITCHING AND STIMULUS GENERATION CAPABILITY REQUIRED FOR TESTING MULTIPLE ADI UNITS UNDER TEST |
| unpackaged_unit_height | 9.000 INCHES NOMINAL IN |
| unpackaged_unit_length | 27.000 INCHES NOMINAL IN |
| end_item_identification | ATTITUDE DIRECTOR INDICATOR |
| reference_data_and_literature | TO 51T7-2-1 |
| part_name_assigned_by_controlling_agency | COMMON BENCHTOP AUTOMATIC TEST SET (CBATS); 115VAC 50/60HZ; 38LBS VAC |
| NSN | 4920-01-540-5520 |
| UNPACKAGED UNIT LENGTH | 27.000 INCHES NOMINAL IN |
| REFERENCE DATA AND LITERATURE | TO 51T7-2-1 |
| UNPACKAGED UNIT WIDTH | 12.000 INCHES NOMINAL IN |
| UNPACKAGED UNIT HEIGHT | 9.000 INCHES NOMINAL IN |
| NONSUPPLY ITEMS AND QUANTITIES | PXI-1042Q PXI 8 SLOT CHASSIS 1; PXI-9196 2GHZ CONTROLLER 1; PXI-2568 GP RELAY MODULE 1; PXI-4072 DMM AND LCR METER 1; PXI-6221 DATA ACQUISITION MODULE 1; GX1838 DC SOURCE PXI BOARD 1; NA75DS1 SYNCHRO/RESOLVER SIMULATION BOARD 1; PXI-2532 MATRIX SWITCH W/NI TB-2640 TERMINAL BLOCK 1; K05-1170 INTERFACE TEST ADAPTER GHz |
| SPECIAL FEATURES | CONSISTS OF PXI/PCI INSTRUMENTS AND A CONTROLLER INSTALLED IN A CHASSIS WITH A COMMON CONNECTOR INTERFACE FOR ADI BEING TESTED |
| FUNCTIONAL DESCRIPTION | PROVIDES MEASUREMENT, SWITCHING AND STIMULUS GENERATION CAPABILITY REQUIRED FOR TESTING MULTIPLE ADI UNITS UNDER TEST |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | COMMON BENCHTOP AUTOMATIC TEST SET (CBATS); 115VAC 50/60HZ; 38LBS VAC |
| END ITEM IDENTIFICATION | ATTITUDE DIRECTOR INDICATOR |
No substitute or cross-reference records for this part.