The SEMICONDUCTOR DEVICE SET is a the manufacturer industrial component. Key specifications include overall_length: 0.295 INCHES MAXIMUM IN, mounting_method: THREADED STUD(S), overall_diameter: 0.340 INCHES MAXIMUM IN, special_features: JUNCTION PATTERN ARRANGEMENT: NPNP, features_provided: HERMETICALLY SEALED CASE, nominal_thread_size: 0.190 INCHES IN. This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 5961-00-001-7317, indicating validated use in U.S.
government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels. Verify compatibility with your specific system configuration before ordering.
| overall_length | 0.295 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| overall_diameter | 0.340 INCHES MAXIMUM IN |
| special_features | JUNCTION PATTERN ARRANGEMENT: NPNP |
| features_provided | HERMETICALLY SEALED CASE |
| nominal_thread_size | 0.190 INCHES IN |
| internal_configuration | JUNCTION CONTACT |
| semiconductor_material | SILICON |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 0.440 INCHES MAXIMUM IN |
| terminal_type_and_quantity | 3 PIN |
| NSN | 5961-00-001-7317 |
| NOMINAL THREAD SIZE | 0.190 INCHES IN |
| OVERALL LENGTH | 0.295 INCHES MAXIMUM IN |
| ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE | COLLECTOR |
| INTERNAL CONFIGURATION | JUNCTION CONTACT |
| MOUNTING METHOD | THREADED STUD(S) |
| CURRENT RATING PER CHARACTERISTIC | 1.50 AMPERES MAXIMUM COLLECTOR CURRENT, DC |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 65.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-BASE, EMITTER OPEN AND 40.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN AND 4.0 MAXIMUM BREAKDOWN VOLTAGE, EMITTER-TO-BASE, COLLECTOR OPEN |
| SPECIAL FEATURES | JUNCTION PATTERN ARRANGEMENT: NPNP |
| THREAD SERIES DESIGNATOR | UNF |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 CELSIUS JUNCTION DEGC |