The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: SILICON SEMICONDUCTOR, overall_length: 0.450 INCHES MAXIMUM IN, mounting_method: THREADED STUD(S), overall_diameter: 0.667 INCHES MAXIMUM IN, features_provided: HERMETICALLY SEALED CASE, nominal_thread_size: 0.250 INCHES IN. This product is currently in active production with full OEM support.
This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 5961-00-498-8410, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | SILICON SEMICONDUCTOR |
| overall_length | 0.450 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| overall_diameter | 0.667 INCHES MAXIMUM IN |
| features_provided | HERMETICALLY SEALED CASE |
| nominal_thread_size | 0.250 INCHES IN |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 0.669 INCHES MINIMUM AND 0.688 INCHES MAXIMUM IN |
| terminal_type_and_quantity | 1 THREADED STUD AND 1 TAB, SOLDER LUG |
| specification/standard_data | 81349-MIL-S-19500/308 GOVERNMENT SPECIFICATION |
| current_rating_per_characteristic | 300.00 AMPERES MAXIMUM FORWARD CURRENT, DC |
| NSN | 5961-00-498-8410 |
| OVERALL DIAMETER | 0.667 INCHES MAXIMUM IN |
| MOUNTING METHOD | THREADED STUD(S) |
| THREAD SERIES DESIGNATOR | UNF |
| MOUNTING FACILITY QUANTITY | 1 |
| CURRENT RATING PER CHARACTERISTIC | 300.00 AMPERES MAXIMUM FORWARD CURRENT, DC |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 100.0 CELSIUS CASE DEGC |
| FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| OVERALL LENGTH | 0.450 INCHES MAXIMUM IN |
| NOMINAL THREAD SIZE | 0.250 INCHES IN |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 200.0 MAXIMUM REVERSE VOLTAGE, PEAK |