H8000212-01F — MICROCIRCUIT,MEMORY

✓ Government record, cited

— · COMPONENT

PRODUCT OVERVIEW

H8000212-01F: MICROCIRCUIT,MEMORY.

The MICROCIRCUIT,MEMORY is a the manufacturer memory module engineered for enterprise server and workstation platforms requiring validated, high-reliability memory. Key specifications include special_features: 16-INPUT, 8-OUTPUT AND/OR INVERT PROGRAMMABLE DIGITAL LOGIC GATE ARRAY MICROCIRCUITS, end_item_identification: APG-73 RADAR SYSTEM F/A-18 A THRU F A, criticality_code_justification: AGAV, part_name_assigned_by_controlling_agency: MICROCIRCUIT, MEMORY - PROGRAMMED LOGIC, MONOLITHIC SILICON. This part is cataloged in the U.S.

Government catalog under NSN 5962-01-520-8197, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.

Verify compatibility with your specific system configuration before ordering.

WHERE IT FITS

H8000212-01F

NSN: 5962-01-520-8197
FSC: 5962 — Microcircuits, Electronic
CAGE: 3B150 — RAYTHEON COMPANY DBA RAYTHEON CO (USA)

SPECIFICATIONS

special_features	16-INPUT, 8-OUTPUT AND/OR INVERT PROGRAMMABLE DIGITAL LOGIC GATE ARRAY MICROCIRCUITS
end_item_identification	APG-73 RADAR SYSTEM F/A-18 A THRU F A
criticality_code_justification	AGAV
part_name_assigned_by_controlling_agency	MICROCIRCUIT, MEMORY - PROGRAMMED LOGIC, MONOLITHIC SILICON
NSN	5962-01-520-8197

COMPONENT DIAGRAM

KEY FEATURES

•

SPECIAL TEST FEATURES: EACH DEVICE SHALL BE ELECTRICALLY TESTED FOR CONFORMANCE TO DESC DRAWING 5962-8515509SX AFTER ALTERATION; TESTING SHALL INCLUDE PARAMETRIC AND FUNCTIONAL ELECTRICAL TESTS I/A/W MIL-STD-883, METHOD 5005, GROUP A, SUBGROUPS 1,2,3,7,8,9,10 AND 11

•

CRITICALITY CODE JUSTIFICATION: AGAV

TYPICAL APPLICATIONS

Server memory expansion for virtualization workloads
Database performance optimization (in-memory computing)
VDI and remote desktop session hosting
High-performance computing (HPC) clusters
Mail server and collaboration platform scaling
Application server tier expansion

TECHNICAL CHARACTERISTICS

SPECIAL TEST FEATURES	EACH DEVICE SHALL BE ELECTRICALLY TESTED FOR CONFORMANCE TO DESC DRAWING 5962-8515509SX AFTER ALTERATION; TESTING SHALL INCLUDE PARAMETRIC AND FUNCTIONAL ELECTRICAL TESTS I/A/W MIL-STD-883, METHOD 5005, GROUP A, SUBGROUPS 1,2,3,7,8,9,10 AND 11
CRITICALITY CODE JUSTIFICATION	AGAV
SPECIAL FEATURES	16-INPUT, 8-OUTPUT AND/OR INVERT PROGRAMMABLE DIGITAL LOGIC GATE ARRAY MICROCIRCUITS
PART NAME ASSIGNED BY CONTROLLING AGENCY	MICROCIRCUIT, MEMORY - PROGRAMMED LOGIC, MONOLITHIC SILICON
END ITEM IDENTIFICATION	APG-73 RADAR SYSTEM F/A-18 A THRU F A

OTHER ITEMS IN FSC 5962 — Microcircuits, Electronic

Items in the same Federal Supply class. No interchangeability or substitution relationship is implied.

5962-00-001-1861 5962-00-001-1901 5962-00-001-1902 5962-00-001-1905 5962-00-001-1906 5962-00-001-1907 5962-00-001-1908 5962-00-001-1909

SUBSTITUTES & CROSS-REFERENCES 1

H8000212-001FSame NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

LIFECYCLE

NSN statusActive· U.S. Government catalog

Acquisition advice: Terminal item — stock exhausted; no further procurementDemilitarization required — mutilation + specific procedure

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FREQUENTLY ASKED QUESTIONS

What is H8000212-01F?

H8000212-01F is a MICROCIRCUIT,MEMORY.

What parts can replace H8000212-01F?

There is 1 known substitute for H8000212-01F: H8000212-001F. Substitute compatibility should be verified for your specific system.

What is the NSN for H8000212-01F?

H8000212-01F is cataloged in the U.S. Government catalog under NSN 5962-01-520-8197. This indicates validated use in U.S. government and defense supply chains.

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