The MICROCIRCUIT,DIGITAL is a the manufacturer industrial component. Key specifications include body_width: 0.280 INCHES MAXIMUM IN, body_height: 0.180 INCHES NOMINAL IN, body_length: 0.785 INCHES MAXIMUM IN, output_logic_form: TRANSISTOR-TRANSISTOR LOGIC, inclosure_material: CERAMIC, operating_temp_range: -55.0 TO 125.0 CELSIUS DEGC. This product is currently in active production with full OEM support.
This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 5962-01-172-4470, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| body_width | 0.280 INCHES MAXIMUM IN |
| body_height | 0.180 INCHES NOMINAL IN |
| body_length | 0.785 INCHES MAXIMUM IN |
| output_logic_form | TRANSISTOR-TRANSISTOR LOGIC |
| inclosure_material | CERAMIC |
| operating_temp_range | -55.0 TO 125.0 CELSIUS DEGC |
| input_circuit_pattern | TRIPLE 3 INPUT |
| special_test_features | TESTED PER BASE TEN SYSTEMS DWG 20295 |
| inclosure_configuration | DUAL-IN-LINE |
| design_function_and_quantity | 3 GATE, NAND |
| NSN | 5962-01-172-4470 |
| INPUT CIRCUIT PATTERN | TRIPLE 3 INPUT |
| BODY HEIGHT | 0.180 INCHES NOMINAL IN |
| BODY LENGTH | 0.785 INCHES MAXIMUM IN |
| INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| DESIGN FUNCTION AND QUANTITY | 3 GATE, NAND |
| SPECIAL TEST FEATURES | TESTED PER BASE TEN SYSTEMS DWG 20295 |
| OPERATING TEMP RANGE | -55.0 TO 125.0 CELSIUS DEGC |
| INCLOSURE MATERIAL | CERAMIC |
| BODY WIDTH | 0.280 INCHES MAXIMUM IN |
| OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |