The SEMICONDUCTOR DEVICE,THYRISTOR is a the manufacturer industrial component. Key specifications include overall_length: 1.810 INCHES MAXIMUM IN, mounting_method: THREADED STUD(S), special_features: JUNCTION PATTERN ARRANGEMENT: PNPN, features_provided: HERMETICALLY SEALED CASE, nominal_thread_size: 0.500 INCHES IN, internal_configuration: JUNCTION CONTACT. This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 5961-00-051-3063, indicating validated use in U.S.
government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels. Verify compatibility with your specific system configuration before ordering.
| overall_length | 1.810 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| special_features | JUNCTION PATTERN ARRANGEMENT: PNPN |
| features_provided | HERMETICALLY SEALED CASE |
| nominal_thread_size | 0.500 INCHES IN |
| internal_configuration | JUNCTION CONTACT |
| semiconductor_material | SILICON |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 1.227 INCHES MAXIMUM IN |
| terminal_type_and_quantity | 1 THREADED STUD AND 2 TAB, SOLDER LUG |
| power_rating_per_characteristic | 500.0 MILLIWATTS MAXIMUM PEAK GATE POWER DISSIPATION |
| NSN | 5961-00-051-3063 |
| THREAD SERIES DESIGNATOR | UNF |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 120.0 MAXIMUM BREAKOVER VOLTAGE, DC |
| CURRENT RATING PER CHARACTERISTIC | 1000.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE |
| MOUNTING METHOD | THREADED STUD(S) |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 125.0 CELSIUS CASE DEGC |
| INTERNAL CONFIGURATION | JUNCTION CONTACT |
| SEMICONDUCTOR MATERIAL | SILICON |
| TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 2 TAB, SOLDER LUG |
| POWER RATING PER CHARACTERISTIC | 500.0 MILLIWATTS MAXIMUM PEAK GATE POWER DISSIPATION |
| SPECIAL FEATURES | JUNCTION PATTERN ARRANGEMENT: PNPN |