C37CX744: SEMICONDUCTOR DEVICE,THYRISTOR.
The SEMICONDUCTOR DEVICE,THYRISTOR is a the manufacturer industrial component. Key specifications include overall_length: 0.505 INCHES MAXIMUM0.505 INCHES MAXIMUM IN, mounting_method: THREADED STUD(S), special_features: JUNCTION PATTERN ARRANGEMENT: PNPNJUNCTION PATTERN ARRANGEMENT: PNPN, features_provided: HERMETICALLY SEALED CASEHERMETICALLY SEALED CASE, nominal_thread_size: 0.250 INCHES0.250 INCHES IN, internal_configuration: JUNCTION CONTACTJUNCTION CONTACT. This part is cataloged in the U.S.
Government catalog under NSN 5961-00-070-6974, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| overall_length | 0.505 INCHES MAXIMUM0.505 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| special_features | JUNCTION PATTERN ARRANGEMENT: PNPNJUNCTION PATTERN ARRANGEMENT: PNPN |
| features_provided | HERMETICALLY SEALED CASEHERMETICALLY SEALED CASE |
| nominal_thread_size | 0.250 INCHES0.250 INCHES IN |
| internal_configuration | JUNCTION CONTACTJUNCTION CONTACT |
| semiconductor_material | SILICONSILICON |
| thread_series_designator | UNFUNF |
| mounting_facility_quantity | 11 |
| overall_width_across_flats | 0.562 INCHES MAXIMUM0.562 INCHES MAXIMUM IN |
| terminal_type_and_quantity | 2 TAB, SOLDER LUG AND 2 TAB, SOLDER LUG AND 1 THREADED STUD1 THREADED STUD |
| power_rating_per_characteristic | 0.5 WATTS MAXIMUM AVERAGE GATE POWER-FORWARD0.5 WATTS MAXIMUM AVERAGE GATE POWER-FORWARD |
| NSN | 5961-00-070-6974 |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 2.3 MAXIMUM FORWARD VOLTAGE, PEAK AND 2.3 MAXIMUM FORWARD VOLTAGE, PEAK AND 3.5 MAXIMUM GATE TRIGGER VOLTAGE, DC3.5 MAXIMUM GATE TRIGGER VOLTAGE, DC |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 105.0 CELSIUS JUNCTION105.0 CELSIUS JUNCTION DEGC |
| MOUNTING FACILITY QUANTITY | 11 |
| MOUNTING METHOD | THREADED STUD(S) |
| SEMICONDUCTOR MATERIAL | SILICONSILICON |
| OVERALL LENGTH | 0.505 INCHES MAXIMUM0.505 INCHES MAXIMUM IN |
| INTERNAL CONFIGURATION | JUNCTION CONTACTJUNCTION CONTACT |
| FEATURES PROVIDED | HERMETICALLY SEALED CASEHERMETICALLY SEALED CASE |
| OVERALL WIDTH ACROSS FLATS | 0.562 INCHES MAXIMUM0.562 INCHES MAXIMUM IN |
| NOMINAL THREAD SIZE | 0.250 INCHES0.250 INCHES IN |