C155B: SEMICONDUCTOR DEVICE,THYRISTOR.
The SEMICONDUCTOR DEVICE,THYRISTOR is a the manufacturer industrial component. Key specifications include material: COPPER ALLOY, overall_length: 1.030 INCHES NOMINAL IN, mounting_method: THREADED STUD(S), special_features: JUNCTION PATTERN ARRANGEMENT: PNPN, features_provided: HERMETICALLY SEALED CASE, nominal_thread_size: 0.500 INCHES IN. This part is cataloged in the U.S.
Government catalog under NSN 5961-00-498-8429, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | COPPER ALLOY |
| overall_length | 1.030 INCHES NOMINAL IN |
| mounting_method | THREADED STUD(S) |
| special_features | JUNCTION PATTERN ARRANGEMENT: PNPN |
| features_provided | HERMETICALLY SEALED CASE |
| nominal_thread_size | 0.500 INCHES IN |
| internal_configuration | JUNCTION CONTACT |
| semiconductor_material | SILICON |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 1.062 INCHES NOMINAL IN |
| terminal_type_and_quantity | 1 THREADED STUD AND 2 TAB, SOLDER LUG |
| NSN | 5961-00-498-8429 |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 240.0 MAXIMUM BREAKOVER VOLTAGE, DC |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 125.0 CELSIUS JUNCTION DEGC |
| MOUNTING FACILITY QUANTITY | 1 |
| MOUNTING METHOD | THREADED STUD(S) |
| SEMICONDUCTOR MATERIAL | SILICON |
| OVERALL LENGTH | 1.030 INCHES NOMINAL IN |
| INTERNAL CONFIGURATION | JUNCTION CONTACT |
| FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| OVERALL WIDTH ACROSS FLATS | 1.062 INCHES NOMINAL IN |
| NOMINAL THREAD SIZE | 0.500 INCHES IN |