C0805C474K3RAC: CAPACITOR,FIXED,CERAMIC DIELECTR.
CAPACITOR,FIXED,CERAMIC DIELECTR. Key specifications include material: CERAMIC CASE, body_style: CHIP TYPE, body_width: 1.2 MILLIMETERS NOMINAL MM, body_height: 0.9 MILLIMETERS NOMINAL MM, body_length: 2.0 MILLIMETERS NOMINAL MM, reliability_indicator: NOT ESTABLISHED. This part is cataloged in the U.S.
Government catalog under NSN 5910-01-575-8768, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | CERAMIC CASE |
| body_style | CHIP TYPE |
| body_width | 1.2 MILLIMETERS NOMINAL MM |
| body_height | 0.9 MILLIMETERS NOMINAL MM |
| body_length | 2.0 MILLIMETERS NOMINAL MM |
| special_features | 25 VOLT, 0805 CHIP SIZE, X7R TEMP COEFFICIANT, 2.12 GOHM INSULATION RESISTANCE, 62.5 VOLT DIELECTRIC STENGTH, TIN TERMINATION |
| reliability_indicator | NOT ESTABLISHED |
| nonderated_operating_temp | -55.0 CELSIUS MINIMUM AND 125.0 CELSIUS MAXIMUM DEGC |
| tolerance_range_per_section | -0.47 TO 0.47 MICROFARADS SINGLE SECTION |
| center_to_center_distance_between_terminals_parallel_to_length | 0.7 MILLIMETERS NOMINAL MM |
| NSN | 5910-01-575-8768 |
| BODY STYLE | CHIP TYPE |
| TOLERANCE RANGE PER SECTION | -0.47 TO 0.47 MICROFARADS SINGLE SECTION |
| NONDERATED OPERATING TEMP | -55.0 CELSIUS MINIMUM AND 125.0 CELSIUS MAXIMUM DEGC |
| BODY WIDTH | 1.2 MILLIMETERS NOMINAL MM |
| BODY HEIGHT | 0.9 MILLIMETERS NOMINAL MM |
| BODY LENGTH | 2.0 MILLIMETERS NOMINAL MM |
| RELIABILITY INDICATOR | NOT ESTABLISHED |
| SPECIAL FEATURES | 25 VOLT, 0805 CHIP SIZE, X7R TEMP COEFFICIANT, 2.12 GOHM INSULATION RESISTANCE, 62.5 VOLT DIELECTRIC STENGTH, TIN TERMINATION |
| MATERIAL | CERAMIC CASE |
| CENTER TO CENTER DISTANCE BETWEEN TERMINALS PARALLEL TO LENGTH | 0.7 MILLIMETERS NOMINAL MM |