91687626: SEMICONDUCTOR DEVICE,DIODE.
The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: SILICON SEMICONDUCTOR, mounting_method: THREADED STUD(S), nominal_thread_size: 0.250 INCHES IN, thread_series_designator: UNF, overall_width_across_flats: 0.687 INCHES NOMINAL IN, current_rating_per_characteristic: 40.00 AMPERES MAXIMUM FORWARD CURRENT, AVERAGE. This part is cataloged in the U.S.
Government catalog under NSN 5961-01-390-1602, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | SILICON SEMICONDUCTOR |
| mounting_method | THREADED STUD(S) |
| nominal_thread_size | 0.250 INCHES IN |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 0.687 INCHES NOMINAL IN |
| current_rating_per_characteristic | 40.00 AMPERES MAXIMUM FORWARD CURRENT, AVERAGE |
| voltage_rating_in_volts_per_characteristic | 1600.0 NOMINAL REPETITIVE PEAK REVERSE VOLTAGE |
| maximum_operating_temp_per_measurement_point | 190.0 CELSIUS JUNCTION DEGC |
| NSN | 5961-01-390-1602 |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 1600.0 NOMINAL REPETITIVE PEAK REVERSE VOLTAGE |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 190.0 CELSIUS JUNCTION DEGC |
| MOUNTING FACILITY QUANTITY | 1 |
| MOUNTING METHOD | THREADED STUD(S) |
| OVERALL WIDTH ACROSS FLATS | 0.687 INCHES NOMINAL IN |
| NOMINAL THREAD SIZE | 0.250 INCHES IN |
| CURRENT RATING PER CHARACTERISTIC | 40.00 AMPERES MAXIMUM FORWARD CURRENT, AVERAGE |
| MATERIAL | SILICON SEMICONDUCTOR |
| THREAD SERIES DESIGNATOR | UNF |
No substitute or cross-reference records for this part.