NSN 6640-01-526-8899 · NIIN 015268899 · Part number 9432 020 13121
Fei Company Div Materials and Stuctural Analysis Division · FSC 6640 — Laboratory Equipment and Supplies · FSG 66 — Instruments and Laboratory Equipment · CAGE 1FJ95
Government record, cited
NSN 6640-01-526-8899 — this item is cataloged by the U.S. Government under National Stock Number 6640-01-526-8899. Manufacturer of record part number: 9432 020 13121.
Also searched as6640-01-526-8899 ·
6640015268899 ·
NIIN 015268899 ·
01-526-8899 ·
FSC 6640 Laboratory Equipment and Supplies · CAGE 1FJ95 · 9432 020 13121
Manufacturer of record: Fei Company Div Materials and Stuctural Analysis Division
Identification
NSN: 6640-01-526-8899
NIIN: 015268899
FSC: 6640 — Laboratory Equipment and Supplies
FSG: 66 — Instruments and Laboratory Equipment
Primary part number: 9432 020 13121
Manufacturer: Fei Company Div Materials and Stuctural Analysis Division
General Description
The Substrate,scanning Electron Micr, cataloged under National Stock Number 6640-01-526-8899, is classified within Federal Supply Class 6640 (Laboratory Equipment and Supplies) of the Instruments and Laboratory Equipment group. The manufacturer of record is Fei Company Div Materials and Stuctural Analysis Division. The record lists 1 manufacturer part number for this item, enabling identification through both NSN and commercial part number lookups. Current acquisition status: Active.
Technical Specifications
Parameter
Value
NSN
6640-01-526-8899
Primary Part Number
9432 020 13121
Item Name
Substrate,scanning Electron Micr
FSC / FSG
6640 / 66 — Laboratory Equipment and Supplies
Manufacturer
Fei Company Div Materials and Stuctural Analysis Division
Status
ACTIVE
Lifecycle & Compliance
Acquisition Status
ACTIVE
DEMIL Code
DEMIL A — No Demilitarization Required
Hazard
Possible hazard — SDS may be required (DLA HMIC P)
Fei Company Div Materials and Stuctural Analysis Division (USA)
No interchangeability data on file.
Other items in FSC 6640 — Laboratory Equipment and Supplies
Items in the same Federal Supply class. No interchangeability or substitution relationship is implied.
6640-00-001-3348
6640-00-001-3348 · Item name not on file
6640-00-001-6670
LID,ANAEROBIC CULTURE APPARATUS
6640-00-001-6868
CONTROLLER,TIME AND TEMPERATURE,
6640-00-001-6871
6640-00-001-6871 · Item name not on file
6640-00-001-8928
6640-00-001-8928 · Item name not on file
6640-00-001-9167
6640-00-001-9167 · Item name not on file
6640-00-001-9168
6640-00-001-9168 · Item name not on file
6640-00-003-4362
6640-00-003-4362 · Item name not on file
Frequently Asked Questions
What is NSN 6640-01-526-8899?
NSN 6640-01-526-8899 is a Substrate,scanning Electron Micr, manufactured by Fei Company Div Materials and Stuctural Analysis Division, classified under FSC 6640, Laboratory Equipment and Supplies. Status: active.
What part numbers are listed for NSN 6640-01-526-8899?
NSN 6640-01-526-8899 has 1 manufacturer part number on file: 9432 020 13121 (Fei Company Div Materials and Stuctural Analysis Division).
What are the specifications of 9432 020 13121?
Key specifications for 9432 020 13121: Part Name Assigned by Controlling Agency: SCANNING ELECTRONIC MICROSCOPE. 0 specifications are documented in the U.S. Government catalog.
Is NSN 6640-01-526-8899 hazardous material?
Possible hazard — SDS may be required (DLA HMIC P). Hazard information on this page is shown exactly as it appears in the DLA record.
Sources
U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-16.
U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-18.
✓ Data cited from the U.S. Government catalog; commercial cross-references from OEM and certified industry sources.