PartsTable TECHNICAL DATA SHEET
NSN 6625-01-458-1374Government record, cited

Scanner, Semiconductor Test Set6625-01-458-1374

NSN 6625-01-458-1374 · NIIN 014581374 · Part number 99-0104
Huntron Inc · FSC 6625 — Electrical and Electronic Properties Measuring and Testing Instruments · FSG 66 — Instruments and Laboratory Equipment · CAGE 57705
Government record, cited
NSN 6625-01-458-1374 — this item is cataloged by the U.S. Government under National Stock Number 6625-01-458-1374. Manufacturer of record part number: 99-0104.
Also searched as  6625-01-458-1374 · 6625014581374 · NIIN 014581374 · 01-458-1374 · FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments · CAGE 57705 · 99-0104
Nearby stock numbers  ·
Features
  • Scanner,semiconductor Test Set — FSC 6625
  • 1 manufacturer part number on file
  • Manufacturer of record: Huntron Inc
Identification
  • NSN: 6625-01-458-1374
  • NIIN: 014581374
  • FSC: 6625 — Electrical and Electronic Properties Measuring and Testing Instruments
  • FSG: 66 — Instruments and Laboratory Equipment
  • Primary part number: 99-0104
  • Manufacturer: Huntron Inc
General Description

The Scanner,semiconductor Test Set, cataloged under National Stock Number 6625-01-458-1374, is classified within Federal Supply Class 6625 (Electrical and Electronic Properties Measuring and Testing Instruments) of the Instruments and Laboratory Equipment group. The manufacturer of record is Huntron Inc. The record lists 1 manufacturer part number for this item, enabling identification through both NSN and commercial part number lookups. Current acquisition status: Active.

Technical Specifications
ParameterValue
NSN6625-01-458-1374
Primary Part Number99-0104
Item NameScanner,semiconductor Test Set
FSC / FSG6625 / 66 — Electrical and Electronic Properties Measuring and Testing Instruments
ManufacturerHuntron Inc
StatusACTIVE
Lifecycle & Compliance
Acquisition StatusACTIVE
DEMIL CodeDEMIL A — No Demilitarization Required
HazardPossible hazard — SDS may be required (DLA HMIC P)
Criticality CodeX
Cross-Reference Index
Part NumberManufacturer
99-0104 PRIMARY Huntron Inc (USA)

Frequently Asked Questions

What is NSN 6625-01-458-1374?

NSN 6625-01-458-1374 is a Scanner,semiconductor Test Set, manufactured by Huntron Inc, classified under FSC 6625, Electrical and Electronic Properties Measuring and Testing Instruments. Status: active.

What part numbers are listed for NSN 6625-01-458-1374?

NSN 6625-01-458-1374 has 1 manufacturer part number on file: 99-0104 (Huntron Inc).

What are the specifications of 99-0104?

Key specifications for 99-0104: Special Features: MOD SCANNER 1. 0 specifications are documented in the U.S. Government catalog.

Is NSN 6625-01-458-1374 hazardous material?

Possible hazard — SDS may be required (DLA HMIC P). Hazard information on this page is shown exactly as it appears in the DLA record.

Sources

U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-16.

U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-18.

✓ Data cited from the U.S. Government catalog; commercial cross-references from OEM and certified industry sources.
PartsTable Design LLC · partstable.com