The Test Set,semiconductor Device, cataloged under National Stock Number 6625-01-419-8132, is classified within Federal Supply Class 6625 (No Item Name Available) of the Instruments and Laboratory Equipment group. The primary manufacturer of record is Dataware Electronics Corp Sub of Dataware Systems Lease Inc. Government technical data includes 6 verified specifications, sourced from the Federal Logistics Information System (FLIS). This item has 3 commercial cross-references from 2 manufacturers, enabling identification through both NSN and commercial part number lookups. 1 verified substitute exists in the FLIS interchangeability database. Current acquisition status: Active.
| Parameter | Value |
|---|---|
| NSN | 6625-01-419-8132 |
| Primary Part Number | 370A-1P |
| Item Name | Test Set,semiconductor Device |
| FSC / FSG | 6625 / 66 — No Item Name Available |
| Manufacturer | Dataware Electronics Corp Sub of Dataware Systems Lease Inc |
| Status | ACTIVE |
| Enclosure Feature | MULTIPLE ITEM W/HOUSING |
| Test Type for Which Designed | PARAMETER CHARACTIZATION OF SEMICONDUCTOR DEVICES |
| Purchase Description Identification | 1T110CONTRACT/F41608-94-C-0785 |
| Enclosure Feature | MULTIPLE ITEM W/HOUSING |
| Test Type for Which Designed | PARAMETER CHARACTIZATION OF SEMICONDUCTOR DEVICES |
| Purchase Description Identification | 1T110CONTRACT/F41608-94-C-0785 |
| Acquisition Status | ACTIVE |
| HAZMAT | No |
NSN 6625-01-419-8132 is a Test Set,semiconductor Device, manufactured by Dataware Electronics Corp Sub of Dataware Systems Lease Inc, classified under FSC 6625 (No Item Name Available). Status: active.
NSN 6625-01-419-8132 has 3 cross-referenced part numbers: 370-1P (Dataware Electronics Corp Sub of Dataware Systems Lease Inc), 370A-1P (Dataware Electronics Corp Sub of Dataware Systems Lease Inc), 370A-1P (Tektronix, Inc.).
There is 1 known substitute for 6625-01-419-8132: 6625-01-258-7065. Verify interchangeability with system specifications before substitution.
Key specifications for 370A-1P: Enclosure Feature: MULTIPLE ITEM W/HOUSING; End Item Identification: COMMON TEST EQUIPMENT; Test Type for Which Designed: PARAMETER CHARACTIZATION OF SEMICONDUCTOR DEVICES; Purchase Description Identification: 1T110CONTRACT/F41608-94-C-0785. 8 total characteristics are documented in the Federal Logistics Information System.