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NSN 6625-01-152-1697Government record, cited

Test Set, Semiconductor Device6625-01-152-1697

NSN 6625-01-152-1697 · NIIN 011521697
FSC 6625 — Electrical and Electronic Properties Measuring and Testing Instruments · FSG 66 — Instruments and Laboratory Equipment
Government record, cited
Also searched as  6625-01-152-1697 · 6625011521697 · NIIN 011521697 · 01-152-1697 · FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments
Nearby stock numbers  ·
Features
  • Test Set,semiconductor Device — FSC 6625
  • Phase: SINGLE LOCATION NOT OTHERWISE SPECIFIED
  • AC Voltage Rating: 115.0 VOLTS NOMINAL LOCATION NOT OTHERWISE SPECIFIED
  • Electrical Power Source Relationship: OPERATING
  • Height: 86.0 MILLIMETERS NOMINAL MM
  • Depth: 286.0 MILLIMETERS NOMINAL MM
  • Enclosure Feature: SINGLE ITEM W/HOUSING
  • Frequency Rating: 60.0 HERTZ NOMINAL LOCATION NOT OTHERWISE SPECIFIED
Identification
  • NSN: 6625-01-152-1697
  • NIIN: 011521697
  • FSC: 6625 — Electrical and Electronic Properties Measuring and Testing Instruments
  • FSG: 66 — Instruments and Laboratory Equipment
General Description

The Test Set,semiconductor Device, cataloged under National Stock Number 6625-01-152-1697, is classified within Federal Supply Class 6625 (Electrical and Electronic Properties Measuring and Testing Instruments) of the Instruments and Laboratory Equipment group. Government technical data includes 9 specifications, cited from the U.S. Government catalog. 1 additional reference document (drawings, advisory and superseded references) is recorded in the U.S. Government catalog. Current acquisition status: Active. Unit of issue: EA.

Technical Specifications
ParameterValue
NSN6625-01-152-1697
Item NameTest Set,semiconductor Device
FSC / FSG6625 / 66 — Electrical and Electronic Properties Measuring and Testing Instruments
StatusACTIVE
PhaseSINGLE LOCATION NOT OTHERWISE SPECIFIED
AC Voltage Rating115.0 VOLTS NOMINAL LOCATION NOT OTHERWISE SPECIFIED
Electrical Power Source RelationshipOPERATING
Height86.0 MILLIMETERS NOMINAL MM
Depth286.0 MILLIMETERS NOMINAL MM
Enclosure FeatureSINGLE ITEM W/HOUSING
Frequency Rating60.0 HERTZ NOMINAL LOCATION NOT OTHERWISE SPECIFIED
Width250.0 MILLIMETERS NOMINAL MM
Test Type for Which DesignedIN-CIRCUIT TESTING OF COMPONENTS
Lifecycle & Compliance
Acquisition StatusACTIVE
DEMIL CodeDEMIL A — No Demilitarization Required
HazardPossible hazard — SDS may be required (DLA HMIC P)
Shelf Life Code0
Criticality CodeX
Unit of IssueEA
Acquisition advice codeVH
Weight2.0000 lbs
Cube1.8229 cu ft
Cross-Reference Index
No manufacturer part numbers on file in the U.S. Government catalog.
Reference documents
ReferenceMeaning
3110 3/9 Design control — primary reference
Vu-Data Corp

Frequently Asked Questions

What is NSN 6625-01-152-1697?

NSN 6625-01-152-1697 is a Test Set,semiconductor Device, classified under FSC 6625, Electrical and Electronic Properties Measuring and Testing Instruments. Status: active.

What are the specifications of 6625-01-152-1697?

Key specifications for 6625-01-152-1697: Phase: SINGLE LOCATION NOT OTHERWISE SPECIFIED; AC Voltage Rating: 115.0 VOLTS NOMINAL LOCATION NOT OTHERWISE SPECIFIED; Electrical Power Source Relationship: OPERATING; Height: 86.0 MILLIMETERS NOMINAL MM. 9 specifications are documented in the U.S. Government catalog.

Is NSN 6625-01-152-1697 hazardous material?

Possible hazard — SDS may be required (DLA HMIC P). Hazard information on this page is shown exactly as it appears in the DLA record.

Sources

U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-16.

U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-18.

✓ Data cited from the U.S. Government catalog; commercial cross-references from OEM and certified industry sources.
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