The Test Set,semiconductor Device, cataloged under National Stock Number 6625-00-367-9323, is classified within Federal Supply Class 6625 (Electrical and Electronic Properties Measuring and Testing Instruments) of the Instruments and Laboratory Equipment group. Government technical data includes 4 specifications, cited from the U.S. Government catalog. 1 additional reference document (drawings, advisory and superseded references) is recorded in the U.S. Government catalog. 1 item shares a part number with this NSN in the catalog (possible match — not a government interchangeability claim). Current acquisition status: Active. Unit of issue: EA.
| Parameter | Value |
|---|---|
| NSN | 6625-00-367-9323 |
| Item Name | Test Set,semiconductor Device |
| FSC / FSG | 6625 / 66 — Electrical and Electronic Properties Measuring and Testing Instruments |
| Status | ACTIVE |
| Supplementary Features | MANUFACTURERS NAME: TRANSISTOR TEST SET |
| Functional Classification | AA-9.3 |
| Enclosure Feature | SINGLE ITEM W/HOUSING |
| Test Type for Which Designed | MEASUREMENT OF TRANSISTORS |
| Acquisition Status | ACTIVE |
| DEMIL Code | DEMIL A — No Demilitarization Required |
| Hazard | Possible hazard — SDS may be required (DLA HMIC P) |
| Shelf Life Code | 0 |
| Criticality Code | X |
| Unit of Issue | EA |
| Acquisition advice code | VU |
| Weight | 2.0000 lbs |
| Cube | 0.1322 cu ft |
| Reference | Meaning |
|---|---|
| 120 | 3/9 Design control — primary reference Fairchild Semiconductor Corp Pcb-Test Testline Div Sub of Schlumberger Ltd |
NSN 6625-00-367-9323 is a Test Set,semiconductor Device, classified under FSC 6625, Electrical and Electronic Properties Measuring and Testing Instruments. Status: active.
1 possible match (shared part number, not a government interchangeability claim): 5999-01-083-2741. Verify interchangeability with system specifications before substitution.
Key specifications for 6625-00-367-9323: Supplementary Features: MANUFACTURERS NAME: TRANSISTOR TEST SET; Functional Classification: AA-9.3; Enclosure Feature: SINGLE ITEM W/HOUSING; Test Type for Which Designed: MEASUREMENT OF TRANSISTORS. 4 specifications are documented in the U.S. Government catalog.
Possible hazard — SDS may be required (DLA HMIC P). Hazard information on this page is shown exactly as it appears in the DLA record.
U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-16.
U.S. Government catalog: edition PUBLOGDVD v12.0.0 (OCT 2026), edition date 2026-10-01, retrieved 2026-10-18.