5962-96690: MICROCIRCUIT,MEMORY.
The MICROCIRCUIT,MEMORY is a the manufacturer memory module engineered for enterprise server and workstation platforms requiring validated, high-reliability memory. Key specifications include body_width: 0.405 INCHES MINIMUM AND 0.415 INCHES MAXIMUM IN, body_height: 0.095 INCHES MINIMUM AND 0.125 INCHES MAXIMUM IN, body_length: 0.810 INCHES MINIMUM AND 0.830 INCHES MAXIMUM IN, special_features: 128K X 8 BIT, features_provided: ELECTROSTATIC SENSITIVE, inclosure_material: CERAMIC. This part is cataloged in the U.S.
Government catalog under NSN 5962-01-456-8743, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| body_width | 0.405 INCHES MINIMUM AND 0.415 INCHES MAXIMUM IN |
| body_height | 0.095 INCHES MINIMUM AND 0.125 INCHES MAXIMUM IN |
| body_length | 0.810 INCHES MINIMUM AND 0.830 INCHES MAXIMUM IN |
| special_features | 128K X 8 BIT |
| features_provided | ELECTROSTATIC SENSITIVE |
| inclosure_material | CERAMIC |
| memory_device_type | EPROM |
| storage_temp_range | -65.0 TO 150.0 CELSIUS DEGC |
| test_data_document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| operating_temp_range | -55.0 TO 125.0 CELSIUS DEGC |
| inclosure_configuration | DUAL-IN-LINE |
| time_rating_per_chacteristic | 120.00 NANOSECONDS NOMINAL ACCESS NS |
| NSN | 5962-01-456-8743 |
| INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| MEMORY DEVICE TYPE | EPROM |
| SPECIAL FEATURES | 128K X 8 BIT |
| VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 4.5 VOLTS MINIMUM TOTAL SUPPLY AND 5.5 VOLTS MAXIMUM TOTAL SUPPLY |
| OPERATING TEMP RANGE | -55.0 TO 125.0 CELSIUS DEGC |
| TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TERMINAL TYPE AND QUANTITY | 32 PRINTED CIRCUIT |