5962-8976901RA: MICROCIRCUIT,DIGITAL.
The MICROCIRCUIT,DIGITAL is a the manufacturer industrial component. Key specifications include features_provided: BURN IN AND HIGH RELIABILITY AND POSITIVE EDGE TRIGGERED AND W/ENABLE, output_logic_form: TRANSISTOR-TRANSISTOR LOGIC, precious_material: GOLD, inclosure_material: CERAMIC, storage_temp_range: -66.0 TO 150.0 CELSIUS DEGC, operating_temp_range: -55.0 TO 125.0 CELSIUS DEGC. This part is cataloged in the U.S.
Government catalog under NSN 5962-01-294-0102, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| features_provided | BURN IN AND HIGH RELIABILITY AND POSITIVE EDGE TRIGGERED AND W/ENABLE |
| output_logic_form | TRANSISTOR-TRANSISTOR LOGIC |
| precious_material | GOLD |
| inclosure_material | CERAMIC |
| storage_temp_range | -66.0 TO 150.0 CELSIUS DEGC |
| operating_temp_range | -55.0 TO 125.0 CELSIUS DEGC |
| input_circuit_pattern | OCTAL 2 INPUT |
| inclosure_configuration | DUAL-IN-LINE |
| design_function_and_quantity | 1 FLIP-FLOP, D-TYPE |
| precious_material_and_location | TERMINALS GOLD |
| NSN | 5962-01-294-0102 |
| INPUT CIRCUIT PATTERN | OCTAL 2 INPUT |
| INCLOSURE MATERIAL | CERAMIC |
| PRECIOUS MATERIAL | GOLD |
| DESIGN FUNCTION AND QUANTITY | 1 FLIP-FLOP, D-TYPE |
| FEATURES PROVIDED | BURN IN AND HIGH RELIABILITY AND POSITIVE EDGE TRIGGERED AND W/ENABLE |
| INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| STORAGE TEMP RANGE | -66.0 TO 150.0 CELSIUS DEGC |
| OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| PRECIOUS MATERIAL AND LOCATION | TERMINALS GOLD |
| OPERATING TEMP RANGE | -55.0 TO 125.0 CELSIUS DEGC |