PartsTable TECHNICAL DATA SHEET
JULY 2026Technical Data Sheet

1N3890Semiconductor Device,diode

General Electric Co Semi-Conductor Products Dept · NSN 5961-00-350-8303 · FSC 5961 · No Item Name Available
Verified by PartsTable
NSN 5961-00-350-8303 — this item is cataloged by the U.S. Government under National Stock Number 5961-00-350-8303. Primary manufacturer part number: 1N3890.
Features
  • Semiconductor Device,diode — FSC 5961
  • Thread Series Designator: UNF
  • Terminal Type and Quantity: 1 THREADED STUD AND 1 TAB, SOLDER LUG
  • Maximum Operating Temp Per Measurement Point: 175.0 CELSIUS AMBIENT AIR DEGC
  • Overall Diameter: 0.424 INCHES MAXIMUM IN
  • Overall Width Across Flats: 0.424 INCHES MINIMUM AND 0.437 INCHES MAXIMUM IN
  • Mounting Facility Quantity: 1
  • Voltage Rating in Volts Per Characteristic: 100.0 MAXIMUM REVERSE VOLTAGE, PEAK
Applications
  • Circuit regulation and filtering
  • Signal conditioning
  • Power supply stabilization
  • Applications requiring Silicon Semiconductor construction
General Description

The Semiconductor Device,diode, cataloged under National Stock Number 5961-00-350-8303, is classified within Federal Supply Class 5961 (No Item Name Available) of the Electrical and Electronic Equipment Components group. The primary manufacturer of record is General Electric Co Semi-Conductor Products Dept. Government technical data includes 14 verified specifications, sourced from the Federal Logistics Information System (FLIS). This item has 26 commercial cross-references from 21 manufacturers, enabling identification through both NSN and commercial part number lookups. 12 verified substitutes exist in the FLIS interchangeability database. Current acquisition status: Cancelled.

Technical Specifications
ParameterValue
NSN5961-00-350-8303
Primary Part Number1N3890
Item NameSemiconductor Device,diode
FSC / FSG5961 / 59 — No Item Name Available
ManufacturerGeneral Electric Co Semi-Conductor Products Dept
StatusCANCELLED
Thread Series DesignatorUNF
Terminal Type and Quantity1 THREADED STUD AND 1 TAB, SOLDER LUG
Maximum Operating Temp Per Measurement Point175.0 CELSIUS AMBIENT AIR DEGC
Overall Diameter0.424 INCHES MAXIMUM IN
Overall Width Across Flats0.424 INCHES MINIMUM AND 0.437 INCHES MAXIMUM IN
Mounting Facility Quantity1
Voltage Rating in Volts Per Characteristic100.0 MAXIMUM REVERSE VOLTAGE, PEAK
Features ProvidedHERMETICALLY SEALED CASE
Specification/standard Data81349-MIL-S-19500/304 GOVERNMENT SPECIFICATION
Mounting MethodTHREADED STUD(S)
Test Data Document81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.).
MaterialSILICON SEMICONDUCTOR
Current Rating Per Characteristic12.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE
Nominal Thread Size0.190 INCHES IN
Lifecycle & Compliance
Acquisition StatusCANCELLED
HAZMATNo
Verified Substitutes 12
5961-00-148-2660537227-1 INTERCHANGEABLE
Semiconductor Device,diode
Raytheon Company Dba Raytheon
5961-00-172-1733 INTERCHANGEABLE
Semiconductor Device,diode
5961-00-189-3175 INTERCHANGEABLE
Semiconductor Device,diode
5961-00-192-00761N3890 INTERCHANGEABLE
Semiconductor Device,diode
Northrop Grumman Systems Corporation Dba Northrop Grumman Systems Corp
5961-00-401-68310N124553-1 INTERCHANGEABLE
Semiconductor Device,diode
National Security Agency
5961-00-451-2206 INTERCHANGEABLE
Semiconductor Device,diode
5961-00-458-6774 INTERCHANGEABLE
Semiconductor Device,diode
5961-00-471-2400 INTERCHANGEABLE
Semiconductor Device,diode
5961-00-484-4604 INTERCHANGEABLE
Semiconductor Device,diode
5961-00-931-0437 INTERCHANGEABLE
Semiconductor Device,diode
Cross-Reference Index
Part NumberManufacturer
1N3890 General Electric Co Semi-Conductor Products Dept (USA)
1N3890 Electronic Devices Inc Dba E D I (USA)
JANTX1N3890A Lacon Electronic Gmbh (DEU)
4178600-510 Raytheon Company Div Rmd Strategic (USA)
JANTX1N3890 Freescale Semiconductor, Inc. (USA)
11-09440-00 Compaq Federal Llc (USA)
MIL-PRF-19500/304 Military Specifications Promulgated by Military Departments/agencies Under Authority of Defense Standardization Manual 4120 3-M
581-032 Ampex Data Systems Corporation Dba Ampex Intelligent Systems (USA)
L02765 Dla Land and Maritime Dba Engineering and Technical Support Div Document Standardization Division (vendor Item Drawings) (USA)
JANTX1N3890A Adelco Elektronik Gmbh (DEU)
947303-8900 Northrop Grumman Systems Corporation Dba Northrop Grumman Systems Corp (USA)
29580-004 Rockwell Collins Deutschland Gmbh Div Rockwell Collins International & Service Solutions (DEU)
IN3890 JAN Military Specifications Promulgated by Military Departments/agencies Under Authority of Defense Standardization Manual 4120 3-M
353-9019-270 Rockwell Collins, Inc. Dba Collins Aerospace Government Systems Div Collins Aerospace - Government Systems (USA)
538163-1 Raytheon Company Dba Raytheon (USA)
SMB604628 Us Army Communications & Electronics Materiel Readiness Command Logistics Engineering Dir (USA)
L02607 Dla Land and Maritime Dba Engineering and Technical Support Div Document Standardization Division (vendor Item Drawings) (USA)
499-016-017 L3harris Interstate Electronics Corporation (USA)
JANTX1N3890 Military Specifications Promulgated by Military Departments/agencies Under Authority of Defense Standardization Manual 4120 3-M
Q531784547 Rheinmetall Air Defence Ag (CHE)
Related Parts
5961-00-148-2660INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
537227-1
5961-00-172-1733INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-189-3175INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-192-0076INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
1N3890
5961-00-401-6831INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
0N124553-1
5961-00-451-2206INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-458-6774INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-471-2400INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-484-4604INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-931-0437INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-931-0568INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE
5961-00-935-4912INTERCHANGEABLE
SEMICONDUCTOR DEVICE,DIODE

Frequently Asked Questions

What is NSN 5961-00-350-8303?

NSN 5961-00-350-8303 is a Semiconductor Device,diode, manufactured by General Electric Co Semi-Conductor Products Dept, classified under FSC 5961 (No Item Name Available). Status: cancelled.

What are the part numbers for NSN 5961-00-350-8303?

NSN 5961-00-350-8303 has 26 cross-referenced part numbers: 1N3890 (General Electric Co Semi-Conductor Products Dept), 1N3890 (Electronic Devices Inc Dba E D I), JANTX1N3890A (Lacon Electronic Gmbh), 4178600-510 (Raytheon Company Div Rmd Strategic), JANTX1N3890 (Freescale Semiconductor, Inc.) and 21 more.

What NSN replaces 5961-00-350-8303?

There are 12 known substitutes for 5961-00-350-8303: 5961-00-148-2660, 5961-00-172-1733, 5961-00-189-3175 and 9 more. Verify interchangeability with system specifications before substitution.

What are the specifications of 1N3890?

Key specifications for 1N3890: Thread Series Designator: UNF; Terminal Type and Quantity: 1 THREADED STUD AND 1 TAB, SOLDER LUG; Maximum Operating Temp Per Measurement Point: 175.0 CELSIUS AMBIENT AIR DEGC; Overall Diameter: 0.424 INCHES MAXIMUM IN. 15 total characteristics are documented in the Federal Logistics Information System.

Is NSN 5961-00-350-8303 still in active supply?

NSN 5961-00-350-8303 is currently cancelled. Check with the Defense Logistics Agency for current availability and authorized substitutes.

Validated with multiple authoritative sources, including Government, OEM, and Certified sources.
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