555275-105: SEMICONDUCTOR DEVICE,DIODE.
The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: SILICON SEMICONDUCTOR, overall_length: 0.765 INCHES NOMINAL IN, mounting_method: PRESS FIT, overall_diameter: 0.221 INCHES NOMINAL IN, special_features: TEST FREQ 16000 MHZ; FREQ RANGE 12.5 TO 17.5 GHZ GHz, features_provided: HERMETICALLY SEALED CASE. This part is cataloged in the U.S.
Government catalog under NSN 5961-00-596-0501, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | SILICON SEMICONDUCTOR |
| overall_length | 0.765 INCHES NOMINAL IN |
| mounting_method | PRESS FIT |
| overall_diameter | 0.221 INCHES NOMINAL IN |
| special_features | TEST FREQ 16000 MHZ; FREQ RANGE 12.5 TO 17.5 GHZ GHz |
| features_provided | HERMETICALLY SEALED CASE |
| terminal_type_and_quantity | 2 PIN |
| specification/standard_data | 80131-RELEASE4910 PROFESSIONAL/INDUSTRIAL ASSOCIATION SPECIFICATION |
| NSN | 5961-00-596-0501 |
| OVERALL DIAMETER | 0.221 INCHES NOMINAL IN |
| MOUNTING METHOD | PRESS FIT |
| OVERALL LENGTH | 0.765 INCHES NOMINAL IN |
| FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| SPECIFICATION/STANDARD DATA | 80131-RELEASE4910 PROFESSIONAL/INDUSTRIAL ASSOCIATION SPECIFICATION |
| SPECIAL FEATURES | TEST FREQ 16000 MHZ; FREQ RANGE 12.5 TO 17.5 GHZ GHz |
| MATERIAL | SILICON SEMICONDUCTOR |
| MATERIAL | CERAMIC ENCLOSURE |
| TERMINAL TYPE AND QUANTITY | 2 PIN |