53E410227-1: TEST SET,ELECTRONIC SYSTEMS.
The TEST SET,ELECTRONIC SYSTEMS is a the manufacturer industrial component. Key specifications include enclosure_feature: SINGLE ITEM W/CARRYING CASE, end_item_identification: F-4 ACFT, test_type_for_which_designed: ELECTRONICS. This part is cataloged in the U.S.
Government catalog under NSN 4920-00-929-9355, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| enclosure_feature | SINGLE ITEM W/CARRYING CASE |
| functional_description | USED FOR PERFORMANCE EVALUATION MALFUNCTION ISOLATION AND CALIBRATION OF ELECTRONIC ALTIMETER AN/APM-156 CAN PERFORM THESE TEST INSTALLED IN THE ACFT OR THE TEST BENCH/115VAC/400 CPS VAC |
| end_item_identification | F-4 ACFT |
| test_type_for_which_designed | ELECTRONICS |
| NSN | 4920-00-929-9355 |
| FUNCTIONAL DESCRIPTION | USED FOR PERFORMANCE EVALUATION MALFUNCTION ISOLATION AND CALIBRATION OF ELECTRONIC ALTIMETER AN/APM-156 CAN PERFORM THESE TEST INSTALLED IN THE ACFT OR THE TEST BENCH/115VAC/400 CPS VAC |
| ENCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| END ITEM IDENTIFICATION | F-4 ACFT |
| TEST TYPE FOR WHICH DESIGNED | ELECTRONICS |
No substitute or cross-reference records for this part.