5100DS/99-0314: TEST SET,SEMICONDUCTOR DEVICE.
The TEST SET,SEMICONDUCTOR DEVICE is a the manufacturer industrial component. Key specifications include frequency_rating: 60.0 HERTZ NOMINAL LOCATION NOT OTHERWISE SPECIFIED, ac_voltage_rating: 115.0 VOLTS NOMINAL AND 230.0 VOLTS NOMINAL LOCATION NOT OTHERWISE SPECIFIED, test_type_for_which_designed: BOLTAGE VS CURRENT, electrical_power_source_relationship: OPERATING. This part is cataloged in the U.S.
Government catalog under NSN 6625-01-358-3159, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| frequency_rating | 60.0 HERTZ NOMINAL LOCATION NOT OTHERWISE SPECIFIED |
| ac_voltage_rating | 115.0 VOLTS NOMINAL AND 230.0 VOLTS NOMINAL LOCATION NOT OTHERWISE SPECIFIED |
| test_type_for_which_designed | BOLTAGE VS CURRENT |
| electrical_power_source_relationship | OPERATING |
| NSN | 6625-01-358-3159 |
| AC VOLTAGE RATING | 115.0 VOLTS NOMINAL AND 230.0 VOLTS NOMINAL LOCATION NOT OTHERWISE SPECIFIED |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| FREQUENCY RATING | 60.0 HERTZ NOMINAL LOCATION NOT OTHERWISE SPECIFIED |
| TEST TYPE FOR WHICH DESIGNED | BOLTAGE VS CURRENT |
No substitute or cross-reference records for this part.