5082-2712: SEMICONDUCTOR DEVICE SET.
The SEMICONDUCTOR DEVICE SET is a the manufacturer industrial component. Key specifications include material: CERAMIC ENCLOSURE ALL SEMICONDUCTOR DEVICE DIODE, overall_length: 0.190 INCHES MINIMUM AND 0.210 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE IN, mounting_method: PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE, overall_diameter: 0.078 INCHES MINIMUM AND 0.084 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE IN, special_features: 9.3 GHZ TEST FREQUENCY; 6.5 DECIBEL NOISE FIGURE GHz, semiconductor_material: SILICON ALL SEMICONDUCTOR DEVICE DIODE. This part is cataloged in the U.S.
Government catalog under NSN 5961-00-175-2844, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | CERAMIC ENCLOSURE ALL SEMICONDUCTOR DEVICE DIODE |
| overall_length | 0.190 INCHES MINIMUM AND 0.210 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE IN |
| mounting_method | PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE |
| overall_diameter | 0.078 INCHES MINIMUM AND 0.084 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE IN |
| special_features | 9.3 GHZ TEST FREQUENCY; 6.5 DECIBEL NOISE FIGURE GHz |
| semiconductor_material | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| terminal_type_and_quantity | 2 BINDING POST ALL SEMICONDUCTOR DEVICE DIODE |
| component_name_and_quantity | 2 SEMICONDUCTOR DEVICE DIODE |
| function_for_which_designed | DETECTOR AND MIXER |
| component_function_relationship | MATCHED |
| maximum_operating_temp_per_measurement_point | 150.0 CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE DEGC |
| NSN | 5961-00-175-2844 |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE DEGC |
| OVERALL DIAMETER | 0.078 INCHES MINIMUM AND 0.084 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE IN |
| COMPONENT FUNCTION RELATIONSHIP | MATCHED |
| MOUNTING METHOD | PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE |
| SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| OVERALL LENGTH | 0.190 INCHES MINIMUM AND 0.210 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE IN |
| COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| FUNCTION FOR WHICH DESIGNED | DETECTOR AND MIXER |
| SPECIAL FEATURES | 9.3 GHZ TEST FREQUENCY; 6.5 DECIBEL NOISE FIGURE GHz |
| MATERIAL | CERAMIC ENCLOSURE ALL SEMICONDUCTOR DEVICE DIODE |