The TEST SET,SEMICONDUCTOR DEVICE is a the manufacturer industrial component. Key specifications include depth: 574.0 MILLIMETERS NOMINAL MM, phase: TWO LOCATION NOT OTHERWISE SPECIFIED, width: 425.5 MILLIMETERS NOMINAL MM, height: 230.0 MILLIMETERS NOMINAL MM, material: STEEL OVERALL, head_style: HEXAGON. This product is currently in active production with full OEM support.
This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 6625-01-259-8161, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| depth | 574.0 MILLIMETERS NOMINAL MM |
| phase | TWO LOCATION NOT OTHERWISE SPECIFIED |
| width | 425.5 MILLIMETERS NOMINAL MM |
| height | 230.0 MILLIMETERS NOMINAL MM |
| material | STEEL OVERALL |
| head_style | HEXAGON |
| grip_length | 0.938 INCHES MINIMUM AND 1.063 INCHES MAXIMUM IN |
| head_height | 0.195 INCHES MINIMUM AND 0.211 INCHES MAXIMUM IN |
| thread_class | 2A A |
| thread_length | 0.875 INCHES MINIMUM AND 1.062 INCHES MAXIMUM IN |
| surface_finish | 63.0 MICROINCHES THREADS |
| fastener_length | 1.938 INCHES MINIMUM AND 2.000 INCHES MAXIMUM IN |
| NSN | 6625-01-259-8161 |
| FREQUENCY RATING | 48.0 HERTZ MINIMUM AND 66.0 HERTZ MAXIMUM LOCATION NOT OTHERWISE SPECIFIED |
| DEPTH | 574.0 MILLIMETERS NOMINAL MM |
| TEST TYPE FOR WHICH DESIGNED | RF IMPEDANCE; SEMICONDUCTOR MEASUREMENT |
| WIDTH | 425.5 MILLIMETERS NOMINAL MM |
| FUNCTIONAL DESCRIPTION | PERFORMS ANALYSIS OF 14 PARAMETERS WITH 4.5 DIGIT RESOLUTION ACROSS A 1 TO 1000 MHZ FREQ RANGE MHz |
| HEIGHT | 230.0 MILLIMETERS NOMINAL MM |
| AC VOLTAGE RATING | 100.0 VOLTS MINIMUM AND 240.0 VOLTS MAXIMUM LOCATION NOT OTHERWISE SPECIFIED |
| PHASE | TWO LOCATION NOT OTHERWISE SPECIFIED |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| ENCLOSURE FEATURE | SINGLE ITEM W/HOUSING |