404820-00: STUD,PLAIN.
The STUD,PLAIN is a the manufacturer industrial component. Key specifications include end_item_identification: CTFGL PMP, departure_from_cited_document: MATERIAL CONTROLLED IAW NAVSEA 0948-LP-045-7010 MATERIAL CONTROL STANDARD FOR LEVEL I ITEMS, criticality_code_justification: ZZZW. This part is cataloged in the U.S.
Government catalog under NSN 5307-01-442-0664, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| end_item_identification | CTFGL PMP |
| departure_from_cited_document | MATERIAL CONTROLLED IAW NAVSEA 0948-LP-045-7010 MATERIAL CONTROL STANDARD FOR LEVEL I ITEMS |
| criticality_code_justification | ZZZW |
| reference_number_differentiating_characteristics | QUALITY CONTROL IN ACCORDANCE WITH NAVSHIPS 0948-045-7010 MATERIAL IDENTIFICATION AND CONTROL INSTRUCTION FOR LEVEL 1 ITEMS |
| NSN | 5307-01-442-0664 |
| CRITICALITY CODE JUSTIFICATION | ZZZW |
| DEPARTURE FROM CITED DOCUMENT | MATERIAL CONTROLLED IAW NAVSEA 0948-LP-045-7010 MATERIAL CONTROL STANDARD FOR LEVEL I ITEMS |
| END ITEM IDENTIFICATION | CTFGL PMP |
| REFERENCE NUMBER DIFFERENTIATING CHARACTERISTICS | QUALITY CONTROL IN ACCORDANCE WITH NAVSHIPS 0948-045-7010 MATERIAL IDENTIFICATION AND CONTROL INSTRUCTION FOR LEVEL 1 ITEMS |