352-1082-010 — TRANSISTOR

✓ Government record, cited

— · SFP TRANSCEIVER

PRODUCT OVERVIEW

352-1082-010: TRANSISTOR.

The TRANSISTOR is a the manufacturer industrial component. Key specifications include material: PLASTIC ENCLOSURE, overall_width: 0.295 INCHES MINIMUM AND 0.305 INCHES MAXIMUM IN, overall_height: 0.095 INCHES MINIMUM AND 0.105 INCHES MAXIMUM IN, overall_length: 0.425 INCHES MINIMUM AND 0.435 INCHES MAXIMUM IN, mounting_method: UNTHREADED HOLE(S), special_features: JUNCTION PATTERN ARRANGEMENT: PNP. This part is cataloged in the U.S.

Government catalog under NSN 5961-01-028-9799, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.

Verify compatibility with your specific system configuration before ordering.

WHERE IT FITS

352-1082-010

NSN: 5961-01-028-9799
FSC: 5961 — Semiconductor Devices and Associated Hardware
CAGE: 13499 — ROCKWELL COLLINS, INC. DBA COLLINS AEROSPACE GOVERNMENT SYSTEMS DIV COLLINS AEROSPACE - GOVERNMENT SYSTEMS (USA)

SPECIFICATIONS

material	PLASTIC ENCLOSURE
overall_width	0.295 INCHES MINIMUM AND 0.305 INCHES MAXIMUM IN
overall_height	0.095 INCHES MINIMUM AND 0.105 INCHES MAXIMUM IN
overall_length	0.425 INCHES MINIMUM AND 0.435 INCHES MAXIMUM IN
mounting_method	UNTHREADED HOLE(S)
special_features	JUNCTION PATTERN ARRANGEMENT: PNP
features_provided	HERMETICALLY SEALED CASE
internal_configuration	JUNCTION CONTACT
semiconductor_material	SILICON
mounting_facility_quantity	2
terminal_type_and_quantity	3 PIN
power_rating_per_characteristic	40.0 WATTS MAXIMUM TOTAL DEVICE DISSIPATION
NSN	5961-01-028-9799

COMPONENT DIAGRAM

KEY FEATURES

•

VOLTAGE RATING IN VOLTS PER CHARACTERISTIC: 60.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-BASE, EMITTER OPEN AND 60.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN AND 5.0 MAXIMUM BREAKDOWN VOLTAGE, EMITTER-TO-BASE, COLLECTOR OPEN

•

MAXIMUM OPERATING TEMP PER MEASUREMENT POINT: 150.0 CELSIUS JUNCTION DEGC

•

MOUNTING FACILITY QUANTITY: 2

•

MOUNTING METHOD: UNTHREADED HOLE(S)

•

SEMICONDUCTOR MATERIAL: SILICON

•

INTERNAL CONFIGURATION: JUNCTION CONTACT

TECHNICAL CHARACTERISTICS

OVERALL HEIGHT	0.095 INCHES MINIMUM AND 0.105 INCHES MAXIMUM IN
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC	60.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-BASE, EMITTER OPEN AND 60.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN AND 5.0 MAXIMUM BREAKDOWN VOLTAGE, EMITTER-TO-BASE, COLLECTOR OPEN
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT	150.0 CELSIUS JUNCTION DEGC
MOUNTING FACILITY QUANTITY	2
MOUNTING METHOD	UNTHREADED HOLE(S)
SEMICONDUCTOR MATERIAL	SILICON
OVERALL LENGTH	0.425 INCHES MINIMUM AND 0.435 INCHES MAXIMUM IN
INTERNAL CONFIGURATION	JUNCTION CONTACT
OVERALL WIDTH	0.295 INCHES MINIMUM AND 0.305 INCHES MAXIMUM IN
FEATURES PROVIDED	HERMETICALLY SEALED CASE

OTHER ITEMS IN FSC 5961 — Semiconductor Devices and Associated Hardware

Items in the same Federal Supply class. No interchangeability or substitution relationship is implied.

5961-00-000-0150 5961-00-000-4541 5961-00-000-5400 5961-00-000-7614 5961-00-000-8760 5961-00-001-1352 5961-00-001-2624 5961-00-001-2978

SUBSTITUTES & CROSS-REFERENCES 2

VA75-0163-1Same NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

MJE700Reference document

Same NSN cross-reference

Reference document — Design control — primary reference

LIFECYCLE

NSN statusActive· U.S. Government catalog

Acquisition advice: Terminal item — no further procurement; issued until stock is exhaustedNo demilitarization required

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FREQUENTLY ASKED QUESTIONS

What is 352-1082-010?

352-1082-010 is a TRANSISTOR.

What parts can replace 352-1082-010?

There are 2 known substitutes for 352-1082-010: VA75-0163-1, MJE700. Substitute compatibility should be verified for your specific system.

What is the NSN for 352-1082-010?

352-1082-010 is cataloged in the U.S. Government catalog under NSN 5961-01-028-9799. This indicates validated use in U.S. government and defense supply chains.

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