323987: TERMINAL,LUG.
Connect with confidence_x000D_ Manhattan Hi-Speed USB 2.0 Device Cables easily connect USB peripherals and accessories with desktop and notebook computers. Ideal for use with many USB external enclosures, hubs and other hot-swap, plug-and-play devices, Manhattan Hi-Speed USB 2.0 Device Cables support data transfer rates up to 480 Mbps on Windows and Mac systems for fast, reliable transmissions. Nickel-plated contacts, shielding and fully moulded boots with strain relief help provide dependable connections, maximum conductivity and minimal data loss with reduced EMI interference.
This part is cataloged in the U.S. Government catalog under NSN 5940-00-113-8173, indicating validated use in U.S. government and defense logistics supply chains.
| material | COPPER ALLOY OVERALL |
| overall_width | 0.312 INCHES IN |
| overall_length | 0.621 INCHES IN |
| basic_shape_style | CRIMP |
| surface_treatment | TIN OVERALL SINGLE LAYER |
| material_thickness | 0.023 INCHES IN |
| mounting_method_style | RING |
| mounting_tongue_width | 0.312 INCHES IN |
| mounting_hole_diameter | 0.147 INCHES IN |
| end_item_identification | 3805-01-537-7952;DITCHING MACHINE RT40 |
| mounting_facility_thickness | 0.023 INCHES IN |
| conductor_accommodation_type | STRAIGHT BARREL SINGLE END |
| NSN | 5940-00-113-8173 |
| OVERALL LENGTH | 0.621 INCHES IN |
| SURFACE TREATMENT DOCUMENT AND CLASSIFICATION | MIL-T-10727,TY 2 MIL SPEC SINGLE TREATMENT RESPONSE OVERALL SINGLE LAYER |
| MOUNTING FACILITY THICKNESS | 0.023 INCHES IN |
| MOUNTING HOLE DIAMETER | 0.147 INCHES IN |
| MATERIAL DOCUMENT AND CLASSIFICATION | AQQ-C-576,SOFT ANNEALED FED SPEC SINGLE MATERIAL RESPONSE OVERALL |
| MAXIMUM CONDUCTOR SIZE ACCOMMODATED | 20 AWG |
| BASIC SHAPE STYLE | CRIMP |
| MOUNTING METHOD STYLE | RING |
| ELECTRICAL INSULATION FEATURE | UNINSULATED |
| OVERALL WIDTH | 0.312 INCHES IN |
No substitute or cross-reference records for this part.