The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: RUBBER SILICONE CLASS Q OVERALL, hole_diameter: 0.247 INCHES MINIMUM AND 0.256 INCHES MAXIMUM FIFTEENTH HOLE IN, overall_width: 3.460 INCHES MINIMUM AND 3.540 INCHES MAXIMUM IN, aperture_width: 2.210 INCHES MINIMUM AND 2.290 INCHES MAXIMUM IN, overall_length: 5.134 INCHES MINIMUM AND 5.154 INCHES MAXIMUM IN, aperture_length: 5.000 INCHES MINIMUM AND 5.030 INCHES MAXIMUM IN. This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 5961-00-800-3972, indicating validated use in U.S.
government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels. Verify compatibility with your specific system configuration before ordering.
| material | RUBBER SILICONE CLASS Q OVERALL |
| hole_diameter | 0.247 INCHES MINIMUM AND 0.256 INCHES MAXIMUM FIFTEENTH HOLE IN |
| overall_width | 3.460 INCHES MINIMUM AND 3.540 INCHES MAXIMUM IN |
| aperture_width | 2.210 INCHES MINIMUM AND 2.290 INCHES MAXIMUM IN |
| overall_length | 5.134 INCHES MINIMUM AND 5.154 INCHES MAXIMUM IN |
| aperture_length | 5.000 INCHES MINIMUM AND 5.030 INCHES MAXIMUM IN |
| hardness_rating | 45.0 SHORE DUROMETER A MINIMUM AND 55.0 SHORE DUROMETER A MAXIMUM OVERALL |
| style_designator | NON-CIRCULAR |
| features_provided | HERMETICALLY SEALED CASE |
| bolt_hole_quantity | 14 |
| special_test_features | SPECIAL QUALITY CONTROL TESTING |
| cross-sectional_thickness | 0.032 INCHES NOMINAL IN |
| NSN | 5961-00-800-3972 |
| TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
| NONDEFINITIVE SPEC/STD DATA | 1N751A TYPE |
| FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| MATERIAL | SILICON SEMICONDUCTOR |