305095: SEMICONDUCTOR DEVICE,THYRISTOR.
Full metal housing Solid full metal housing for protection against outside interference Fully shielded Fully shielded lines for optimal reduction of electromagnetic interference Return path compatible Return path compatible connection for interactive applications such as DSL via satellite This part is cataloged in the U.S. Government catalog under NSN 5961-01-293-6489, indicating validated use in U.S. government and defense logistics supply chains.
Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels. Verify compatibility with your specific system configuration before ordering.
| overall_length | 1.646 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| nominal_thread_size | 0.250 INCHES IN |
| semiconductor_material | SILICON |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 0.544 INCHES MINIMUM AND 0.562 INCHES MAXIMUM IN |
| terminal_type_and_quantity | 1 THREADED STUD AND 2 TAB, SOLDER LUG |
| current_rating_per_characteristic | 150.00 AMPERES MAXIMUM PEAK ON-STATE SURGE CURRENT |
| voltage_rating_in_volts_per_characteristic | 200.0 MAXIMUM REPETITIVE PEAK OFF-STATE VOLTAGE |
| joint_electronic_device_engineering_council/jedec/case_outline_designation | TO-48 |
| NSN | 5961-01-293-6489 |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 200.0 MAXIMUM REPETITIVE PEAK OFF-STATE VOLTAGE |
| MOUNTING FACILITY QUANTITY | 1 |
| JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | TO-48 |
| MOUNTING METHOD | THREADED STUD(S) |
| SEMICONDUCTOR MATERIAL | SILICON |
| OVERALL LENGTH | 1.646 INCHES MAXIMUM IN |
| OVERALL WIDTH ACROSS FLATS | 0.544 INCHES MINIMUM AND 0.562 INCHES MAXIMUM IN |
| NOMINAL THREAD SIZE | 0.250 INCHES IN |
| CURRENT RATING PER CHARACTERISTIC | 150.00 AMPERES MAXIMUM PEAK ON-STATE SURGE CURRENT |
| TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 2 TAB, SOLDER LUG |