The SEMICONDUCTOR DEVICE,THYRISTOR is a the manufacturer industrial component. Key specifications include overall_length: 0.505 INCHES MAXIMUM IN, mounting_method: THREADED STUD(S), overall_diameter: 0.650 INCHES MAXIMUM IN, special_features: JUNCTION PATTERN ARRANGEMENT: PNPN, features_provided: HERMETICALLY SEALED CASE, nominal_thread_size: 0.250 INCHES IN. This part is cataloged in the Federal Logistics Information System (FLIS) under NSN 5961-00-926-0270, indicating validated use in U.S.
government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels. Verify compatibility with your specific system configuration before ordering.
| overall_length | 0.505 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| overall_diameter | 0.650 INCHES MAXIMUM IN |
| special_features | JUNCTION PATTERN ARRANGEMENT: PNPN |
| features_provided | HERMETICALLY SEALED CASE |
| nominal_thread_size | 0.250 INCHES IN |
| internal_configuration | JUNCTION CONTACT |
| semiconductor_material | SILICON |
| thread_series_designator | UNF |
| mounting_facility_quantity | 1 |
| overall_width_across_flats | 0.562 INCHES MAXIMUM IN |
| terminal_type_and_quantity | 2 TAB, SOLDER LUG AND 1 THREADED STUD |
| NSN | 5961-00-926-0270 |
| NOMINAL THREAD SIZE | 0.250 INCHES IN |
| OVERALL WIDTH ACROSS FLATS | 0.562 INCHES MAXIMUM IN |
| SEMICONDUCTOR MATERIAL | SILICON |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 400.0 MAXIMUM BREAKOVER VOLTAGE, DC |
| MOUNTING METHOD | THREADED STUD(S) |
| THREAD SERIES DESIGNATOR | UNF |
| OVERALL DIAMETER | 0.650 INCHES MAXIMUM IN |
| MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 120.0 CELSIUS JUNCTION DEGC |
| OVERALL LENGTH | 0.505 INCHES MAXIMUM IN |
| CURRENT RATING PER CHARACTERISTIC | 16.00 AMPERES MAXIMUM COLLECTOR CURRENT, DC |