227B7790-1 — MICROCIRCUIT,DIGITAL

✓ Government record, cited

— · COMPONENT

PRODUCT OVERVIEW

227B7790-1: MICROCIRCUIT,DIGITAL.

The MICROCIRCUIT,DIGITAL is a the manufacturer industrial component. Key specifications include features_provided: TESTED TO MIL-STD-883 AND 3-STATE OUTPUT, output_logic_form: COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC, inclosure_material: CERAMIC, memory_device_type: EEPROM, operating_temp_range: -55.0 TO 125.0 CELSIUS DEGC, end_item_identification: 1430-01-378-6963 GUIDE MISSILE BATTERY CONTROL. This part is cataloged in the U.S.

Government catalog under NSN 5962-01-451-1878, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.

Verify compatibility with your specific system configuration before ordering.

WHERE IT FITS

227B7790-1

NSN: 5962-01-451-1878
FSC: 5962 — Microcircuits, Electronic
CAGE: 05606 — GENERAL DYNAMICS-OTS, INC. DIV ORDNANCE AND TACTICAL SYSTEMS (USA)

SPECIFICATIONS

features_provided	TESTED TO MIL-STD-883 AND 3-STATE OUTPUT
output_logic_form	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
inclosure_material	CERAMIC
memory_device_type	EEPROM
operating_temp_range	-55.0 TO 125.0 CELSIUS DEGC
end_item_identification	1430-01-378-6963 GUIDE MISSILE BATTERY CONTROL
inclosure_configuration	DUAL-IN-LINE
terminal_surface_treatment	SOLDER
part_name_assigned_by_controlling_agency	16K (2K X 8) CMOS EEPROM
voltage_rating_and_type_per_characteristic	5.0 VOLTS NOMINAL INPUT
NSN	5962-01-451-1878

COMPONENT DIAGRAM

KEY FEATURES

•

INCLOSURE MATERIAL: CERAMIC

•

TERMINAL SURFACE TREATMENT: SOLDER

•

FEATURES PROVIDED: TESTED TO MIL-STD-883 AND 3-STATE OUTPUT

•

INCLOSURE CONFIGURATION: DUAL-IN-LINE

•

MEMORY DEVICE TYPE: EEPROM

•

OUTPUT LOGIC FORM: COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC

•

VOLTAGE RATING AND TYPE PER CHARACTERISTIC: 5.0 VOLTS NOMINAL INPUT

•

OPERATING TEMP RANGE: -55.0 TO 125.0 CELSIUS DEGC

TECHNICAL CHARACTERISTICS

INCLOSURE MATERIAL	CERAMIC
TERMINAL SURFACE TREATMENT	SOLDER
FEATURES PROVIDED	TESTED TO MIL-STD-883 AND 3-STATE OUTPUT
INCLOSURE CONFIGURATION	DUAL-IN-LINE
MEMORY DEVICE TYPE	EEPROM
OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
VOLTAGE RATING AND TYPE PER CHARACTERISTIC	5.0 VOLTS NOMINAL INPUT
OPERATING TEMP RANGE	-55.0 TO 125.0 CELSIUS DEGC
PART NAME ASSIGNED BY CONTROLLING AGENCY	16K (2K X 8) CMOS EEPROM
END ITEM IDENTIFICATION	1430-01-378-6963 GUIDE MISSILE BATTERY CONTROL

SUBSTITUTES & CROSS-REFERENCES 3

ROM/PROMReference document

Same NSN cross-reference

Reference document — Secondary reference

AT28C17E-25DM/883Same NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

AT28C17-25DM/883Reference document

Same NSN cross-reference

Reference document — Secondary reference

LIFECYCLE

NSN statusActive· U.S. Government catalog

Acquisition advice: Insurance item — stocked against contingency demandDemilitarization required — mutilation

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FREQUENTLY ASKED QUESTIONS

What is 227B7790-1?

227B7790-1 is a MICROCIRCUIT,DIGITAL.

What parts can replace 227B7790-1?

There are 3 known substitutes for 227B7790-1: ROM/PROM, AT28C17E-25DM/883, AT28C17-25DM/883. Substitute compatibility should be verified for your specific system.

What is the NSN for 227B7790-1?

227B7790-1 is cataloged in the U.S. Government catalog under NSN 5962-01-451-1878. This indicates validated use in U.S. government and defense supply chains.

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227B7790-1 — MICROCIRCUIT,DIGITAL

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