2001260: SEMICONDUCTOR DEVICE,PHOTO.
The SEMICONDUCTOR DEVICE,PHOTO is a the manufacturer industrial component. Key specifications include overall_length: 0.220 INCHES MAXIMUM IN, mounting_method: THREADED STUD(S), terminal_length: 0.350 INCHES NOMINAL IN, overall_diameter: 0.800 INCHES MAXIMUM IN, special_features: JUNCTION PATTERN ARRANGEMENT: PN, features_provided: HERMETICALLY SEALED CASE. This part is cataloged in the U.S.
Government catalog under NSN 5961-01-374-5520, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| overall_length | 0.220 INCHES MAXIMUM IN |
| mounting_method | THREADED STUD(S) |
| terminal_length | 0.350 INCHES NOMINAL IN |
| overall_diameter | 0.800 INCHES MAXIMUM IN |
| special_features | JUNCTION PATTERN ARRANGEMENT: PN |
| features_provided | HERMETICALLY SEALED CASE |
| nominal_thread_size | 0.112 INCHES IN |
| internal_configuration | JUNCTION CONTACT |
| semiconductor_material | SILICON |
| thread_quantity_per_inch | 40 |
| thread_series_designator | UNIFIED NATIONAL COARSE (UNC) |
| mounting_facility_quantity | 1 |
| NSN | 5961-01-374-5520 |
| MOUNTING FACILITY QUANTITY | 1 |
| OVERALL DIAMETER | 0.800 INCHES MAXIMUM IN |
| TERMINAL LENGTH | 0.350 INCHES NOMINAL IN |
| MOUNTING METHOD | THREADED STUD(S) |
| SEMICONDUCTOR MATERIAL | SILICON |
| OVERALL LENGTH | 0.220 INCHES MAXIMUM IN |
| INTERNAL CONFIGURATION | JUNCTION CONTACT |
| FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| NOMINAL THREAD SIZE | 0.112 INCHES IN |
| SPECIAL FEATURES | JUNCTION PATTERN ARRANGEMENT: PN |
No substitute or cross-reference records for this part.