1901-1096: SEMICONDUCTOR DEVICE,DIODE.
The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: SILICON SEMICONDUCTOR, mounting_method: TERMINAL, special_features: TEST FREQUENCY 100 MHZ; CAPACITANCE .3PF MAX; WEAPON SYSTEM ESSENTIAL; JUNCTION PATTERN ARRANGEMENT: PN MHz, features_provided: HERMETICALLY SEALED CASE, terminal_type_and_quantity: 2 UNINSULATED WIRE LEAD, criticality_code_justification: FEAT. This part is cataloged in the U.S.
Government catalog under NSN 5961-01-153-7606, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| material | SILICON SEMICONDUCTOR |
| mounting_method | TERMINAL |
| special_features | TEST FREQUENCY 100 MHZ; CAPACITANCE .3PF MAX; WEAPON SYSTEM ESSENTIAL; JUNCTION PATTERN ARRANGEMENT: PN MHz |
| features_provided | HERMETICALLY SEALED CASE |
| terminal_type_and_quantity | 2 UNINSULATED WIRE LEAD |
| criticality_code_justification | FEAT |
| voltage_rating_in_volts_per_characteristic | 200.0 MAXIMUM BREAKDOWN VOLTAGE, DC |
| NSN | 5961-01-153-7606 |
| VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 200.0 MAXIMUM BREAKDOWN VOLTAGE, DC |
| MOUNTING METHOD | TERMINAL |
| CRITICALITY CODE JUSTIFICATION | FEAT |
| FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| SPECIAL FEATURES | TEST FREQUENCY 100 MHZ; CAPACITANCE .3PF MAX; WEAPON SYSTEM ESSENTIAL; JUNCTION PATTERN ARRANGEMENT: PN MHz |
| END ITEM IDENTIFICATION | SUPPORT EQUIPMENT, B-1 AIRCRAFT; CALIBRATION STANDARDS EQUIPMENT; GENERAL PURPOSE ELECTRONIC TEST EQUIPMENT GPETE; AIRCRAFT, EAGLE F-15; SUPPORT EQUIPMENT, F-15 AIRCRAFT; NIMITZ CLASS CVN; STRATEGIC WEAPON SYSTEMS (POSEIDON AND TRIDENT); WASP CLASS LHD |
| MATERIAL | SILICON SEMICONDUCTOR |
| MATERIAL | GLASS ENCLOSURE |
| TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |