150-025003-002: TEST SET SUBASSEMBLY,ELECTRICAL.
TEST SET SUBASSEMBLY,ELECTRICAL. Key specifications include special_features: COMPONENT TYPE AND QUANTITY: SEMICONDUCTOR DEVICE DIODE 5, end_item_identification: AN/ALQ-155,5865-01-085-9657, component_type_and_quantity: 2 MICROCIRCUIT AND 30 RESISTOR. This part is cataloged in the U.S.
Government catalog under NSN 6625-01-321-4606, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.
Verify compatibility with your specific system configuration before ordering.
| special_features | COMPONENT TYPE AND QUANTITY: SEMICONDUCTOR DEVICE DIODE 5 |
| end_item_identification | AN/ALQ-155,5865-01-085-9657 |
| component_type_and_quantity | 2 MICROCIRCUIT AND 30 RESISTOR |
| NSN | 6625-01-321-4606 |
| COMPONENT TYPE AND QUANTITY | 2 MICROCIRCUIT AND 30 RESISTOR |
| SPECIAL FEATURES | COMPONENT TYPE AND QUANTITY: SEMICONDUCTOR DEVICE DIODE 5 |
| END ITEM IDENTIFICATION | AN/ALQ-155,5865-01-085-9657 |
No substitute or cross-reference records for this part.