1202554-1 — SEMICONDUCTOR DEVICE,DIODE

✓ Government record, cited

— · SFP TRANSCEIVER

PRODUCT OVERVIEW

1202554-1: SEMICONDUCTOR DEVICE,DIODE.

The SEMICONDUCTOR DEVICE,DIODE is a the manufacturer industrial component. Key specifications include material: GLASS OR CERAMIC ENCLOSURE, overall_length: 1.200 INCHES NOMINAL IN, mounting_method: THREADED STUD(S), overall_diameter: 0.310 INCHES NOMINAL IN, terminal_type_and_quantity: 2 CONNECTOR, COAXIAL, function_for_which_designed: DETECTOR. This part is cataloged in the U.S.

Government catalog under NSN 5961-01-156-7029, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.

Verify compatibility with your specific system configuration before ordering.

WHERE IT FITS

1202554-1

NSN: 5961-01-156-7029
FSC: 5961 — Semiconductor Devices and Associated Hardware
CAGE: 56232 — LOCKHEED MARTIN CORPORATION DIV RMS - MITCHEL FIELD (USA)

SPECIFICATIONS

material	GLASS OR CERAMIC ENCLOSURE
overall_length	1.200 INCHES NOMINAL IN
mounting_method	THREADED STUD(S)
overall_diameter	0.310 INCHES NOMINAL IN
mounting_facility_quantity	2
terminal_type_and_quantity	2 CONNECTOR, COAXIAL
function_for_which_designed	DETECTOR
capacitance_rating_in_picofarads	20.0 NOMINAL
maximum_operating_temp_per_measurement_point	100.0 CELSIUS AMBIENT AIR DEGC
NSN	5961-01-156-7029

COMPONENT DIAGRAM

KEY FEATURES

•

MAXIMUM OPERATING TEMP PER MEASUREMENT POINT: 100.0 CELSIUS AMBIENT AIR DEGC

•

MOUNTING FACILITY QUANTITY: 2

•

OVERALL DIAMETER: 0.310 INCHES NOMINAL IN

•

MOUNTING METHOD: THREADED STUD(S)

•

CAPACITANCE RATING IN PICOFARADS: 20.0 NOMINAL

•

FUNCTION FOR WHICH DESIGNED: DETECTOR

•

TEST DATA DOCUMENT: 53711-5399645 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING)

TECHNICAL CHARACTERISTICS

MAXIMUM OPERATING TEMP PER MEASUREMENT POINT	100.0 CELSIUS AMBIENT AIR DEGC
MOUNTING FACILITY QUANTITY	2
OVERALL DIAMETER	0.310 INCHES NOMINAL IN
MOUNTING METHOD	THREADED STUD(S)
OVERALL LENGTH	1.200 INCHES NOMINAL IN
CAPACITANCE RATING IN PICOFARADS	20.0 NOMINAL
FUNCTION FOR WHICH DESIGNED	DETECTOR
TEST DATA DOCUMENT	53711-5399645 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING)
MATERIAL	GLASS OR CERAMIC ENCLOSURE
TERMINAL TYPE AND QUANTITY	2 CONNECTOR, COAXIAL

OTHER ITEMS IN FSC 5961 — Semiconductor Devices and Associated Hardware

Items in the same Federal Supply class. No interchangeability or substitution relationship is implied.

5961-00-000-0150 5961-00-000-4541 5961-00-000-5400 5961-00-000-7614 5961-00-000-8760 5961-00-001-1352 5961-00-001-2624 5961-00-001-2978

SUBSTITUTES & CROSS-REFERENCES 4

D0X188BRReference document

Same NSN cross-reference

Reference document — Secondary reference

STDET-17009Same NSN cross-reference

Same NSN cross-reference

Also cataloged under this NSN

5961PL1264030Reference document

Same NSN cross-reference

Reference document — Informative reference only

5399645-1Reference document

Same NSN cross-reference

Reference document — Secondary reference

LIFECYCLE

NSN statusActive· U.S. Government catalog

Acquisition advice: Terminal item — stock exhausted; no further procurementNo demilitarization required

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FREQUENTLY ASKED QUESTIONS

What is 1202554-1?

1202554-1 is a SEMICONDUCTOR DEVICE,DIODE.

What parts can replace 1202554-1?

There are 4 known substitutes for 1202554-1: D0X188BR, STDET-17009, 5961PL1264030 and 1 more. Substitute compatibility should be verified for your specific system.

What is the NSN for 1202554-1?

1202554-1 is cataloged in the U.S. Government catalog under NSN 5961-01-156-7029. This indicates validated use in U.S. government and defense supply chains.

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1202554-1 — SEMICONDUCTOR DEVICE,DIODE

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