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0P830WSL — SEMICONDUCTOR DEVICE,PHOTO

✓ Government record, cited
— · SFP TRANSCEIVER
PRODUCT OVERVIEW

0P830WSL: SEMICONDUCTOR DEVICE,PHOTO.

The SEMICONDUCTOR DEVICE,PHOTO is a the manufacturer industrial component. Key specifications include overall_length: 0.187 INCHES MINIMUM AND 0.202 INCHES MAXIMUM IN, mounting_method: UNTHREADED HOLE(S), semiconductor_material: SILICON, voltage_rating_in_volts_per_characteristic: 15.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN, maximum_operating_temp_per_measurement_point: 125.0 CELSIUS AMBIENT AIR DEGC, joint_electronic_device_engineering_council/jedec/case_outline_designation: TO-18. This part is cataloged in the U.S.

Government catalog under NSN 5961-01-444-8076, indicating validated use in U.S. government and defense logistics supply chains. Available through authorized enterprise resellers and TPM (Third Party Maintenance) channels.

Verify compatibility with your specific system configuration before ordering.

WHERE IT FITS
0P830WSL
NSN: 5961-01-444-8076
FSC: 5961 — Semiconductor Devices and Associated Hardware
CAGE: 32694 — OPTEK TECHNOLOGY, INC (USA)
SPECIFICATIONS
overall_length0.187 INCHES MINIMUM AND 0.202 INCHES MAXIMUM IN
mounting_methodUNTHREADED HOLE(S)
semiconductor_materialSILICON
mounting_facility_quantity1
voltage_rating_in_volts_per_characteristic15.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN
maximum_operating_temp_per_measurement_point125.0 CELSIUS AMBIENT AIR DEGC
joint_electronic_device_engineering_council/jedec/case_outline_designationTO-18
NSN5961-01-444-8076
COMPONENT DIAGRAM
BAIL LATCH 10G SFP+ 850nm · SR (MMF, 300m) DOM: Digital Optical Monitoring TX RX LC DUPLEX 20-PIN EDGE CONNECTOR ~56.5 mm ~13.4mm SFP+ TRANSCEIVER | 10G | 850nm | SR (MMF, 300m) Hot-swappable | LC duplex fiber | DDM/DOM supported TITLE SFP+ XCVR PN 0P830WSL MFR OEM SEMICONDUCTOR DEVICE,PHOTO
KEY FEATURES
•
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC: 15.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN
•
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT: 125.0 CELSIUS AMBIENT AIR DEGC
•
MOUNTING FACILITY QUANTITY: 1
•
JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION: TO-18
•
MOUNTING METHOD: UNTHREADED HOLE(S)
•
SEMICONDUCTOR MATERIAL: SILICON
TECHNICAL CHARACTERISTICS
VOLTAGE RATING IN VOLTS PER CHARACTERISTIC15.0 MAXIMUM BREAKDOWN VOLTAGE, COLLECTOR-TO-EMITTER, BASE OPEN
MAXIMUM OPERATING TEMP PER MEASUREMENT POINT125.0 CELSIUS AMBIENT AIR DEGC
MOUNTING FACILITY QUANTITY1
JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATIONTO-18
MOUNTING METHODUNTHREADED HOLE(S)
SEMICONDUCTOR MATERIALSILICON
OVERALL LENGTH0.187 INCHES MINIMUM AND 0.202 INCHES MAXIMUM IN
OTHER ITEMS IN FSC 5961 — Semiconductor Devices and Associated Hardware
Items in the same Federal Supply class. No interchangeability or substitution relationship is implied.
5961-00-000-0150 5961-00-000-4541 5961-00-000-5400 5961-00-000-7614 5961-00-000-8760 5961-00-001-1352 5961-00-001-2624 5961-00-001-2978
SUBSTITUTES & CROSS-REFERENCES 1
95215152Same NSN cross-reference
Same NSN cross-reference
Also cataloged under this NSN
LIFECYCLE
NSN statusActive· U.S. Government catalog
No demilitarization required
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FREQUENTLY ASKED QUESTIONS
What is 0P830WSL?
0P830WSL is a SEMICONDUCTOR DEVICE,PHOTO.
What parts can replace 0P830WSL?
There is 1 known substitute for 0P830WSL: 95215152. Substitute compatibility should be verified for your specific system.
What is the NSN for 0P830WSL?
0P830WSL is cataloged in the U.S. Government catalog under NSN 5961-01-444-8076. This indicates validated use in U.S. government and defense supply chains.
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